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Popkov, Kirill Andreevich
Statistics Math-Net.Ru
Total publications: 61
Scientific articles: 61

Number of views:
This page:896
Abstract pages:10522
Full texts:3450
References:1932
Popkov, Kirill Andreevich
Senior Researcher
Doctor of physico-mathematical sciences
E-mail:

https://www.mathnet.ru/eng/person87435
List of publications on Google Scholar
List of publications on ZentralBlatt

Publications in Math-Net.Ru Citations
2024
1. K. A. Popkov, “Letter to the Editors”, Diskr. Mat., 36:3 (2024),  149  mathnet
2. K. A. Popkov, “Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates”, Mat. Zametki, 115:1 (2024),  91–107  mathnet  mathscinet; Math. Notes, 115:1 (2024), 77–88  scopus
2023
3. K. A. Popkov, “Short tests for contact circuits under one-type weakly connected faults of contacts”, Diskr. Mat., 35:4 (2023),  69–78  mathnet
4. K. A. Popkov, “Short Complete Diagnostic Tests for Circuits Implementing Linear Boolean Functions”, Mat. Zametki, 113:1 (2023),  75–89  mathnet  mathscinet; Math. Notes, 113:1 (2023), 80–92  scopus 1
5. K. A. Popkov, “Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts”, Prikl. Diskr. Mat., 2023, no. 62,  71–82  mathnet
2022
6. K. A. Popkov, “Short conditional complete diagnostic tests for circuits under one-type constant faults of gates”, Diskr. Mat., 34:3 (2022),  63–69  mathnet; Discrete Math. Appl., 33:6 (2023), 381–386
7. K. A. Popkov, “Short complete diagnostic tests for circuits with two additional inputs in some basis”, Diskr. Mat., 34:2 (2022),  67–82  mathnet; Discrete Math. Appl., 33:4 (2023), 219–230 3
8. K. A. Popkov, “On Self-Correcting Logic Circuits of Unreliable Gates with at Most Two Inputs”, Mat. Zametki, 111:1 (2022),  145–148  mathnet  mathscinet; Math. Notes, 111:1 (2022), 157–160  isi  scopus 1
9. K. A. Popkov, “Short complete diagnostic tests for circuits with one additional input in the standard basis”, Prikl. Diskr. Mat., 2022, no. 56,  104–112  mathnet 2
10. K. A. Popkov, “Short single fault detection tests for logic networks under arbitrary faults of gates”, Prikl. Diskr. Mat., 2022, no. 55,  59–76  mathnet  mathscinet 2
11. K. A. Popkov, “Short complete diagnostic tests for logic circuits in one infinite basis”, Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2022, no. 5,  51–54  mathnet  mathscinet  zmath  elib; Moscow University Mathematics Bulletin, 77:5 (2022), 250–253
2021
12. K. A. Popkov, “On implementation of Boolean functions by contact circuits of minimal uniform width”, Diskr. Mat., 33:4 (2021),  94–109  mathnet; Discrete Math. Appl., 32:6 (2022), 403–415
13. K. A. Popkov, “On self-correcting logic circuits of unreliable gates”, Keldysh Institute preprints, 2021, 049, 18 pp.  mathnet 1
14. K. A. Popkov, “On logic networks allowing short single fault detection tests under arbitrary faults of gates”, Prikl. Diskr. Mat., 2021, no. 51,  85–100  mathnet 3
2020
15. K. A. Popkov, “On implementation of boolean functions by contact circuits with a constant uniform width”, Dokl. RAN. Math. Inf. Proc. Upr., 495 (2020),  65–68  mathnet  zmath  elib; Dokl. Math., 102:3 (2020), 502–504 1
16. K. A. Popkov, “Bounds on Shannon functions of lengths of contact closure tests for contact circuits”, Diskr. Mat., 32:3 (2020),  49–67  mathnet  mathscinet  elib; Discrete Math. Appl., 31:3 (2021), 165–178  isi  scopus 2
17. K. A. Popkov, “Short single diagnostic tests for contact circuits under breaks and closures of contacts”, Intelligent systems. Theory and applications, 24:1 (2020),  143–152  mathnet
18. K. A. Popkov, “Short Tests of Closures for Contact Circuits”, Mat. Zametki, 107:4 (2020),  591–603  mathnet  mathscinet  elib; Math. Notes, 107:4 (2020), 653–662  isi  scopus 5
19. K. A. Popkov, “On the implementation of Boolean functions by contact circuits with uniform width 3”, Uchenye Zapiski Kazanskogo Universiteta. Seriya Fiziko-Matematicheskie Nauki, 162:3 (2020),  350–358  mathnet 1
2019
20. K. A. Popkov, “Short complete fault detection tests for logic networks with fan-in two”, Diskretn. Anal. Issled. Oper., 26:1 (2019),  89–113  mathnet; J. Appl. Industr. Math., 13:1 (2019), 118–131  scopus 4
21. K. A. Popkov, “On diagnostic tests of contact break for contact circuits”, Diskr. Mat., 31:2 (2019),  123–142  mathnet  mathscinet  elib; Discrete Math. Appl., 30:2 (2020), 103–116  isi  scopus 6
22. K. A. Popkov, “A method of construction of easily diagnosable logic networks regarding single faults”, Keldysh Institute preprints, 2019, 081, 29 pp.  mathnet  elib 1
23. K. A. Popkov, “Short single fault detection tests for contact circuits under breaks and closures of contacts”, Intelligent systems. Theory and applications, 23:3 (2019),  97–130  mathnet 5
24. K. A. Popkov, “On complete diagnostic tests for contact diagrams during opening and/or closing of contacts”, University proceedings. Volga region. Physical and mathematical sciences, 2019, no. 3,  5–24  mathnet 1
25. K. A. Popkov, “A method for constructing logic networks allowing short single diagnostic tests”, Prikl. Diskr. Mat., 2019, no. 46,  38–57  mathnet 5
26. K. A. Popkov, “Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates”, Prikl. Diskr. Mat., 2019, no. 43,  78–100  mathnet  elib 4
27. K. A. Popkov, “Minimal complete fault detection tests for circuits of functional elements in the standard basis”, Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2019, no. 4,  54–57  mathnet  mathscinet 1
2018
28. K. A. Popkov, “Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates”, Diskretn. Anal. Issled. Oper., 25:2 (2018),  62–81  mathnet  elib; J. Appl. Industr. Math., 12:2 (2018), 302–312  scopus 2
29. K. A. Popkov, “Short single tests for circuits with arbitrary stuck-at faults at outputs of gates”, Diskr. Mat., 30:3 (2018),  99–116  mathnet  mathscinet  elib; Discrete Math. Appl., 29:5 (2019), 321–333  isi  scopus 9
30. K. A. Popkov, “On diagnostic tests of contact break for contact circuits”, Keldysh Institute preprints, 2018, 271, 24 pp.  mathnet  elib 1
31. K. A. Popkov, “Short complete fault detection tests for logic networks with fan-in two”, Keldysh Institute preprints, 2018, 197, 24 pp.  mathnet  elib
32. K. A. Popkov, “Minimal complete fault detection tests for logic networks in the standard basis”, Keldysh Institute preprints, 2018, 161, 7 pp.  mathnet  elib
33. K. A. Popkov, “Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates”, Keldysh Institute preprints, 2018, 149, 32 pp.  mathnet  elib 2
34. K. A. Popkov, “Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates”, Keldysh Institute preprints, 2018, 087, 18 pp.  mathnet  elib 3
35. K. A. Popkov, “Short single tests for logic networks under arbitrary stuck-at faults at outputs of gates”, Keldysh Institute preprints, 2018, 033, 23 pp.  mathnet  elib 1
36. K. A. Popkov, “Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates”, Intelligent systems. Theory and applications, 22:3 (2018),  131–147  mathnet 3
37. K. A. Popkov, “Complete diagnostic length $2$ tests for logic networks under inverse faults of logic gates”, Trudy Mat. Inst. Steklova, 301 (2018),  219–224  mathnet  mathscinet  elib; Proc. Steklov Inst. Math., 301 (2018), 207–212  isi  elib  scopus 4
2017
38. K. A. Popkov, “On the exact value of the length of the minimal single diagnostic test for a particular class of circuits”, Diskretn. Anal. Issled. Oper., 24:3 (2017),  80–103  mathnet  elib; J. Appl. Industr. Math., 11:3 (2017), 431–443  scopus 4
39. K. A. Popkov, “On fault detection tests of contact break for contact circuits”, Diskr. Mat., 29:4 (2017),  66–86  mathnet  elib; Discrete Math. Appl., 28:6 (2018), 369–383  isi  scopus 12
40. K. A. Popkov, “Lower bounds for lengths of single tests for Boolean circuits”, Diskr. Mat., 29:2 (2017),  53–69  mathnet  elib; Discrete Math. Appl., 29:1 (2019), 23–33  isi  scopus 11
41. K. A. Popkov, “Complete diagnostic tests of the length two for logic networks under inverse faults of logic gates”, Keldysh Institute preprints, 2017, 105, 10 pp.  mathnet 2
42. K. A. Popkov, “Complete fault detection tests of the length two for logic networks under stuck-at faults of gates”, Keldysh Institute preprints, 2017, 104, 16 pp.  mathnet 2
43. K. A. Popkov, “Single fault detection tests for logic networks in the basis “conjunction-negation””, Keldysh Institute preprints, 2017, 030, 31 pp.  mathnet 3
44. K. A. Popkov, “Single fault detection tests for logic networks of AND, NOT gates”, Prikl. Diskr. Mat., 2017, no. 38,  66–88  mathnet 4
2016
45. K. A. Popkov, “Tests of contact closure for contact circuits”, Diskr. Mat., 28:1 (2016),  87–100  mathnet  mathscinet  elib; Discrete Math. Appl., 26:5 (2016), 299–308  isi  scopus 8
46. K. A. Popkov, “Lower bounds on lengths of single tests for logic circuits”, Keldysh Institute preprints, 2016, 139, 21 pp.  mathnet 2
47. K. A. Popkov, “Lower bounds on lengths of complete diagnostic tests for circuits and inputs of circuits”, Keldysh Institute preprints, 2016, 060, 12 pp.  mathnet 2
48. K. A. Popkov, “On single diagnostic tests for logic circuits in the Zhegalkin basis”, Keldysh Institute preprints, 2016, 050, 16 pp.  mathnet 7
49. K. A. Popkov, “On tests of contact closure for contact circuits”, Keldysh Institute preprints, 2016, 014, 20 pp.  mathnet
50. K. A. Popkov, “On single diagnostic tests for logic circuits in the Zhegalkin basis”, University proceedings. Volga region. Physical and mathematical sciences, 2016, no. 3,  3–18  mathnet 2
51. K. A. Popkov, “Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits”, Prikl. Diskr. Mat., 2016, no. 4(34),  65–73  mathnet 10
2015
52. K. A. Popkov, “Estimations on lengths of tests of functional elements under a large number of permissible faults”, Diskretn. Anal. Issled. Oper., 22:5 (2015),  52–70  mathnet  mathscinet  elib; J. Appl. Industr. Math., 9:4 (2015), 559–569
53. K. A. Popkov, “Single tests for logical gates”, Diskr. Mat., 27:2 (2015),  73–93  mathnet  mathscinet  elib; Discrete Math. Appl., 25:6 (2015), 367–382  isi  scopus 1
54. K. A. Popkov, “On an exact length value of a minimal single diagnostic test for one class of circuits”, Keldysh Institute preprints, 2015, 074, 20 pp.  mathnet 8
55. K. A. Popkov, “Estimation of fault detection and diagnostic tests' length for contacts”, University proceedings. Volga region. Physical and mathematical sciences, 2015, no. 2,  108–121  mathnet
56. K. A. Popkov, “Single tests for contacts”, Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2015, no. 5,  13–18  mathnet  mathscinet; Moscow University Mathematics Bulletin, 70:5 (2015), 208–212  isi  scopus
2014
57. K. A. Popkov, “Estimates for lengths of check and diagnostic tests of functional elements”, Diskretn. Anal. Issled. Oper., 21:6 (2014),  73–89  mathnet  mathscinet 2
58. K. A. Popkov, “Fault detection and diagnostic tests for logic gates”, Diskr. Mat., 26:2 (2014),  83–99  mathnet  mathscinet  elib; Discrete Math. Appl., 24:4 (2014), 213–225  scopus 1
59. K. A. Popkov, “Check and diagnostic tests for AND, OR, and NOT gates”, Vestnik Moskov. Univ. Ser. 1. Mat. Mekh., 2014, no. 6,  40–44  mathnet  mathscinet; Moscow University Mathematics Bulletin, 69:6 (2014), 267–271  scopus 2
2013
60. K. A. Popkov, “The diagnosis of states of contacts”, Diskr. Mat., 25:4 (2013),  30–40  mathnet  mathscinet  elib; Discrete Math. Appl., 23:5-6 (2013), 479–489  scopus 2

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