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Preprints of the Keldysh Institute of Applied Mathematics, 2016, 139, 21 pp.
DOI: https://doi.org/10.20948/prepr-2016-139 (Mi ipmp2214) 		 
This article is cited in 2 scientific papers (total in 2 papers)

Lower bounds on lengths of single tests for logic circuits

K. A. Popkov
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DOI: https://doi.org/10.20948/prepr-2016-139
Abstract: Nontrivial lower bounds on lengths of the minimal single fault detection and diagnostic tests for logic circuits in wide classes of bases in presence of one-type or arbitrary constant faults on outputs of gates are obtained.
Keywords: logic circuit, fault, single fault detection test, single diagnostic test.
Funding agency Grant number
Russian Foundation for Basic Research 14-01-00598_а
Russian Academy of Sciences - Federal Agency for Scientific Organizations
Document Type: Preprint
Language: Russian
Citation: K. A. Popkov, “Lower bounds on lengths of single tests for logic circuits”, Keldysh Institute preprints, 2016, 139, 21 pp.
Citation in format AMSBIB
\Bibitem{Pop16}
\by K.~A.~Popkov
\paper Lower bounds on lengths of single tests for logic circuits
\jour Keldysh Institute preprints
\yr 2016
\papernumber 139
\totalpages 21
\mathnet{http://mi.mathnet.ru/ipmp2214}
\crossref{https://doi.org/10.20948/prepr-2016-139}
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  • https://www.mathnet.ru/eng/ipmp/y2016/p139
    • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Препринты Института прикладной математики им. М. В. Келдыша РАН
     
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