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Trudy Matematicheskogo Instituta imeni V.A. Steklova, 2018, Volume 301, Pages 219–224
DOI: https://doi.org/10.1134/S0371968518020164 (Mi tm3905) 		 
This article is cited in 4 scientific papers (total in 4 papers)

Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates

K. A. Popkov

Keldysh Institute of Applied Mathematics, Russian Academy of Sciences, Miusskaya pl. 4, Moscow, 125047 Russia
Full-text PDF (165 kB) Citations (4)
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DOI: https://doi.org/10.1134/S0371968518020164
Abstract: It is proved that any Boolean function can be implemented by a logic network in the basis {x&y&z,x⊕y,1} in such a way that this logic network admits a complete diagnostic test of length at most 2 with respect to inverse faults at the outputs of logic gates.
Funding agency Grant number
Russian Science Foundation 14-21-00025
This work is supported by the Russian Science Foundation under grant 14-21-00025.
Received: October 9, 2017
English version:
Proceedings of the Steklov Institute of Mathematics, 2018, Volume 301, Pages 207–212
DOI: https://doi.org/10.1134/S0081543818040168
Bibliographic databases:
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: K. A. Popkov, “Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates”, Complex analysis, mathematical physics, and applications, Collected papers, Trudy Mat. Inst. Steklova, 301, MAIK Nauka/Interperiodica, Moscow, 2018, 219–224; Proc. Steklov Inst. Math., 301 (2018), 207–212
Citation in format AMSBIB
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    • This publication is cited in the following 4 articles:
    1. K. A. Popkov, “Short Complete Diagnostic Tests for Circuits Implementing Linear Boolean Functions”, Math. Notes, 113:1 (2023), 80–92  mathnet  crossref  crossref  mathscinet
    2. K. A. Popkov, “On Self-Correcting Logic Circuits of Unreliable Gates with at Most Two Inputs”, Math. Notes, 111:1 (2022), 157–160  mathnet  crossref  crossref  mathscinet  isi
    3. I. G. Lyubich, D. S. Romanov, “Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases”, Discrete Math. Appl., 32:1 (2022), 1–9  mathnet  crossref  crossref  mathscinet
    4. I. G. Lyubich, D. S. Romanov, “Single Fault Diagnostic Tests for Inversion Faults of Circuit Elements Over Some Bases”, Comput Math Model, 30:1 (2019), 36  crossref  mathscinet
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Труды Математического института имени В. А. Стеклова Proceedings of the Steklov Institute of Mathematics
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    References:44
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