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Diskretnaya Matematika, 2020, Volume 32, Issue 3, Pages 49–67
DOI: https://doi.org/10.4213/dm1607 (Mi dm1607) 		 
This article is cited in 2 scientific papers (total in 2 papers)

Bounds on Shannon functions of lengths of contact closure tests for contact circuits

K. A. Popkov

Keldysh Institute of Applied Mathematics
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DOI: https://doi.org/10.4213/dm1607
Abstract: We consider the problem of synthesis of irredundant two-pole contact circuits which implement $n$-place Boolean functions and allow short single fault detection or diagnostic tests of closures of at most $k$ contacts. We prove that the Shannon function of the length of a fault detection test is equal to $n$ for any $n$ and $k$, and that the Shannon function of the length of a diagnostic test is majorized by $n+k(n-2)$ for $n\geqslant 2$.
Keywords: contact circuit, contact closure, Boolean function, fault detection test, diagnostic test, Shannon function.
Received: 27.12.2019
English version:
Discrete Mathematics and Applications, 2021, Volume 31, Issue 3, Pages 165–178
DOI: https://doi.org/10.1515/dma-2021-0015
Bibliographic databases:
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: K. A. Popkov, “Bounds on Shannon functions of lengths of contact closure tests for contact circuits”, Diskr. Mat., 32:3 (2020), 49–67; Discrete Math. Appl., 31:3 (2021), 165–178
Citation in format AMSBIB
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    • This publication is cited in the following 2 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Дискретная математика
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