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Matematicheskie Zametki, 2020, Volume 107, Issue 4, Pages 591–603
DOI: https://doi.org/10.4213/mzm12374 (Mi mzm12374) 		 
This article is cited in 5 scientific papers (total in 5 papers)

Short Tests of Closures for Contact Circuits

K. A. Popkov

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
Full-text PDF (521 kB) Citations (5)
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DOI: https://doi.org/10.4213/mzm12374
Abstract: The problem of representing Boolean functions by two-pole contact circuits that are irredundant and admit short fault detection or diagnostic tests of closures of at most $k$ contacts for a given positive integer $k$ is considered. The following assertions are proved: for almost every Boolean function of $n$ variables, the minimal length of a fault detection (diagnostic) test is equal to $2$ (does not exceed $2k+2$, respectively).
Keywords: contact circuit, contact closure, fault detection test, diagnostic test.
Funding agency Grant number
Russian Science Foundation 19-71-30004
This work was supported by the Russian Science Foundation under grant 19-71-30004.
Received: 10.03.2019
Revised: 23.07.2019
English version:
Mathematical Notes, 2020, Volume 107, Issue 4, Pages 653–662
DOI: https://doi.org/10.1134/S0001434620030323
Bibliographic databases:
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: K. A. Popkov, “Short Tests of Closures for Contact Circuits”, Mat. Zametki, 107:4 (2020), 591–603; Math. Notes, 107:4 (2020), 653–662
Citation in format AMSBIB
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    • This publication is cited in the following 5 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Математические заметки Mathematical Notes
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