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Preprints of the Keldysh Institute of Applied Mathematics, 2016, 050, 16 pp.
DOI: https://doi.org/10.20948/prepr-2016-50
(Mi ipmp2126)
 

This article is cited in 7 scientific papers (total in 7 papers)

On single diagnostic tests for logic circuits in the Zhegalkin basis

K. A. Popkov
Full-text PDF (357 kB) Citations (7)
References:
Abstract: We consider a problem of synthesis of irredundant logic circuits in the basis $\{\&,\oplus,1,0\}$ which implement Boolean functions on $n$ variables and allow short single diagnostic tests regarding constant faults of type $0$ at outputs of gates. For each Boolean function, the minimal possible length value of such a test is found. In particular, it is proved that this value does not exceed two.
Keywords: logic circuit, fault, single diagnostic test.
Document Type: Preprint
Language: Russian
Citation: K. A. Popkov, “On single diagnostic tests for logic circuits in the Zhegalkin basis”, Keldysh Institute preprints, 2016, 050, 16 pp.
Citation in format AMSBIB
\Bibitem{Pop16}
\by K.~A.~Popkov
\paper On single diagnostic tests for logic circuits in the Zhegalkin basis
\jour Keldysh Institute preprints
\yr 2016
\papernumber 050
\totalpages 16
\mathnet{http://mi.mathnet.ru/ipmp2126}
\crossref{https://doi.org/10.20948/prepr-2016-50}
Linking options:
  • https://www.mathnet.ru/eng/ipmp2126
  • https://www.mathnet.ru/eng/ipmp/y2016/p50
  • This publication is cited in the following 7 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Препринты Института прикладной математики им. М. В. Келдыша РАН
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    Abstract page:147
    Full-text PDF :44
    References:32
     
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