|
This article is cited in 7 scientific papers (total in 7 papers)
On single diagnostic tests for logic circuits in the Zhegalkin basis
K. A. Popkov
Abstract:
We consider a problem of synthesis of irredundant logic circuits in the basis $\{\&,\oplus,1,0\}$ which implement Boolean functions on $n$ variables and allow short single diagnostic tests regarding constant faults of type $0$ at outputs of gates. For each Boolean function, the minimal possible length value of such a test is found. In particular, it is proved that this value does not exceed two.
Keywords:
logic circuit, fault, single diagnostic test.
Citation:
K. A. Popkov, “On single diagnostic tests for logic circuits in the Zhegalkin basis”, Keldysh Institute preprints, 2016, 050, 16 pp.
Linking options:
https://www.mathnet.ru/eng/ipmp2126 https://www.mathnet.ru/eng/ipmp/y2016/p50
|
Statistics & downloads: |
Abstract page: | 147 | Full-text PDF : | 44 | References: | 32 |
|