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This article is cited in 4 scientific papers (total in 4 papers)
On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
K. A. Popkov Keldysh Institute of Applied Mathematics,
4 Miusskaya Sq., 125047 Moscow, Russia
Abstract:
Under consideration is the problem of synthesis of irredundant logic circuits in the basis
$\{\mathbin{\&},\vee,\neg\}$ which implement Boolean functions of $n$ variables and
allow some short single diagnostic tests regarding uniform constant faults at outputs of gates.
For each Boolean function permitting implementation by an irredundant circuit,
the minimal possible length value of such a test is found. In particular,
we prove that this value is at most $2$. Illustr. 3, bibliogr. 27.
Keywords:
logic circuit, fault, single diagnostic test.
Received: 08.06.2016 Revised: 27.02.2017
Citation:
K. A. Popkov, “On the exact value of the length of the minimal single diagnostic test for a particular class of circuits”, Diskretn. Anal. Issled. Oper., 24:3 (2017), 80–103; J. Appl. Industr. Math., 11:3 (2017), 431–443
Linking options:
https://www.mathnet.ru/eng/da876 https://www.mathnet.ru/eng/da/v24/i3/p80
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Abstract page: | 228 | Full-text PDF : | 111 | References: | 42 | First page: | 6 |
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