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This article is cited in 2 scientific papers (total in 2 papers)
Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
K. A. Popkov Keldysh Institute of Applied Mathematics, 4 Miusskaya Sq., 125047 Moscow, Russia
Abstract:
We consider the problem of the synthesis of the logic networks implementing Boolean functions of n variables and allowing short complete fault detection tests regarding arbitrary stuck-at faults at the outputs of gates. We prove that there exists a basis consisting of two Boolean functions of at most four variables in which we can implement each Boolean function by a network allowing such a test with length at most 2. Illustr. 1, bibliogr. 33.
Keywords:
logic network, stuck-at fault, complete fault detection test.
Received: 06.10.2017
Citation:
K. A. Popkov, “Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates”, Diskretn. Anal. Issled. Oper., 25:2 (2018), 62–81; J. Appl. Industr. Math., 12:2 (2018), 302–312
Linking options:
https://www.mathnet.ru/eng/da896 https://www.mathnet.ru/eng/da/v25/i2/p62
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