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This article is cited in 3 scientific papers (total in 3 papers)
Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates
K. A. Popkov
Abstract:
The following assertions are proved: for each natural $k$ and each Boolean constant $p$, there exists a basis consisting of a Boolean function on $\max(k+1; 3)$ variables and negation of one variable (there exists a basis consisting of a Boolean function on not more than $2,5k+2$ variables and negation of this function), in which one can implement any Boolean function except a Boolean constant $p$ by a logic network which is irredundant and allows a fault detection test (a diagnostic test, respectively) with a length not exceeding $2$ under not more than $k$ stuck-at-$p$ faults at inputs and outputs of gates. It is shown that, when considering only stuck-at-$p$ faults at inputs of gates, one can reduce the mentioned bounds on lengths of tests to $1$.
Keywords:
logic network, one-type stuck-at fault, fault detection test, diagnostic test.
Citation:
K. A. Popkov, “Synthesis of easily testable logic networks under one-type stuck-at faults at inputs and outputs of gates”, Keldysh Institute preprints, 2018, 087, 18 pp.
Linking options:
https://www.mathnet.ru/eng/ipmp2447 https://www.mathnet.ru/eng/ipmp/y2018/p87
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Abstract page: | 118 | Full-text PDF : | 30 | References: | 18 |
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