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Diskretnaya Matematika, 2017, Volume 29, Issue 2, Pages 53–69
DOI: https://doi.org/10.4213/dm1429 (Mi dm1429) 		 
This article is cited in 10 scientific papers (total in 11 papers)

Lower bounds for lengths of single tests for Boolean circuits

K. A. Popkov

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow
Full-text PDF (464 kB) Citations (11)
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DOI: https://doi.org/10.4213/dm1429
Abstract: We obtain nontrivial lower bounds for lengths of minimal single fault detection and diagnostic tests for Boolean circuits in wide classes of bases in presence of stuck-at faults at outputs of circuit gates.
Keywords: Boolean circuit, stuck-at fault, single fault detection test, single diagnostic test.
Funding agency Grant number
Russian Foundation for Basic Research 14-01-00598
Russian Academy of Sciences - Federal Agency for Scientific Organizations
Received: 16.09.2016
English version:
Discrete Mathematics and Applications, 2019, Volume 29, Issue 1, Pages 23–33
DOI: https://doi.org/10.1515/dma-2019-0004
Bibliographic databases:
Document Type: Article
UDC: 519.718.7
Language: Russian
Citation: K. A. Popkov, “Lower bounds for lengths of single tests for Boolean circuits”, Diskr. Mat., 29:2 (2017), 53–69; Discrete Math. Appl., 29:1 (2019), 23–33
Citation in format AMSBIB
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  • https://doi.org/10.4213/dm1429
  • https://www.mathnet.ru/eng/dm/v29/i2/p53
    • This publication is cited in the following 11 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    		Дискретная математика
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    Abstract page:412
    Full-text PDF :88
    References:62
    First page:34
     
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