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Publications in Math-Net.Ru |
Citations |
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2022 |
1. |
Mikhail A. Lobaev, Anatoly L. Vikharev, Aleksey M. Gorbachev, Dmitry B. Radishev, Ekaterina A. Arkhipova, Mikhail N. Drozdov, Vladimir A. Isaev, Sergey A. Bogdanov, Vladimir A. Kukushkin, “Investigation of boron-doped delta layers in CVD diamond grown on single-sector HPHT substrates”, Nanosystems: Physics, Chemistry, Mathematics, 13:5 (2022), 578–584 |
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2021 |
2. |
B. N. Zvonkov, O. V. Vikhrova, Yu. A. Danilov, P. B. Demina, M. V. Dorokhin, M. N. Drozdov, D. A. Zdoroveishchev, I. L. Kalentyeva, Yu. M. Kuznetsov, A. V. Kudrin, A. V. Nezhdanov, A. E. Parafin, D. V. Khomitsky, “Pulsed laser irradiation of light-emitting structures with a (Ga,Mn)As layer”, Fizika Tverdogo Tela, 63:9 (2021), 1245–1252 ; Phys. Solid State, 63:11 (2021), 1593–1600 |
3. |
A. I. Okhapkin, S. A. Kraev, E. A. Arkhipova, V. M. Daniltsev, O. I. Khrykin, P. A. Yunin, M. N. Drozdov, “Effect of the chloropentafluoroethane additive in chlorine-containing plasma on the etching rate and etching-profile characteristics of gallium arsenide”, Fizika i Tekhnika Poluprovodnikov, 55:10 (2021), 837–840 ; Semiconductors, 55:11 (2021), 865–868 |
4. |
Yu. A. Danilov, A. V. Alaferdov, O. V. Vikhrova, D. A. Zdoroveishchev, V. A. Koval'skii, R. N. Kriukov, Yu. M. Kuznetsov, V. P. Lesnikov, A. V. Nezhdanov, M. N. Drozdov, “Doping of carbon layers grown by the pulsed laser technique”, Fizika i Tekhnika Poluprovodnikov, 55:8 (2021), 637–643 ; Semiconductors, 55:8 (2021), 660–666 |
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2020 |
5. |
A. B. Tolstoguzov, M. N. Drozdov, A. E. Ieshkin, A. A. Tatarintsev, A. V. Myakon'kikh, S. F. Belykh, N. G. Korobeishchikov, V. O. Pelenovich, D. J. Fu, “Influence of the finite-size effect on the cluster ion emission of silicon nanostructures”, Pis'ma v Zh. Èksper. Teoret. Fiz., 111:8 (2020), 531–535 ; JETP Letters, 111:8 (2020), 467–471 |
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6. |
N. D. Abrosimova, M. N. Drozdov, S. V. Obolensky, “Secondary-ion mass spectroscopy for analysis of the implanted hydrogen profile in silicon and impurity composition of silicon-on-insulator structures”, Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020), 1850–1853 ; Tech. Phys., 65:11 (2020), 1767–1770 |
7. |
Yu. A. Danilov, M. V. Ved, O. V. Vikhrova, N. V. Dikareva, M. N. Drozdov, B. N. Zvonkov, V. A. Koval'skii, R. N. Kriukov, A. V. Kudrin, V. P. Lesnikov, P. A. Yunin, A. M. Andreev, “Carbon films produced by the pulsed laser method and their influence on the properties of GaAs structures”, Fizika i Tekhnika Poluprovodnikov, 54:9 (2020), 868–872 ; Semiconductors, 54:9 (2020), 1059–1063 |
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8. |
A. I. Okhapkin, P. A. Yunin, E. A. Arkhipova, S. A. Kraev, S. A. Korolev, M. N. Drozdov, V. I. Shashkin, “Formation of ohmic contacts to a diamond-like carbon layer deposited on a dielectric diamond substrate”, Fizika i Tekhnika Poluprovodnikov, 54:9 (2020), 865–867 ; Semiconductors, 54:9 (2020), 1056–1058 |
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9. |
P. A. Yunin, A. I. Okhapkin, M. N. Drozdov, S. A. Korolev, E. A. Arkhipova, S. A. Kraev, Yu. N. Drozdov, V. I. Shashkin, D. B. Radishev, “Modification of the ratio between $sp^2/sp^3$-hybridized carbon components in PECVD diamond-like films”, Fizika i Tekhnika Poluprovodnikov, 54:9 (2020), 855–858 ; Semiconductors, 54:9 (2020), 1047–1050 |
10. |
B. N. Zvonkov, O. V. Vikhrova, Yu. A. Danilov, M. V. Dorokhin, P. B. Demina, M. N. Drozdov, A. V. Zdoroveyshchev, R. N. Kriukov, A. V. Nezhdanov, I. N. Antonov, S. M. Plankina, M. P. Temiryazeva, “Formation of carbon layers by the thermal decomposition of carbon tetrachloride in a reactor for MOCVD epitaxy”, Fizika i Tekhnika Poluprovodnikov, 54:8 (2020), 801–806 ; Semiconductors, 54:8 (2020), 956–960 |
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11. |
A. M. Gorbachev, M. A. Lobaev, D. B. Radishev, A. L. Vikharev, S. A. Bogdanov, S. V. Bolshedvorskii, A. I. Zeleneev, V. V. Soshenko, A. V. Akimov, M. N. Drozdov, V. A. Isaev, “Formation of multilayered nanostructures of NV sites in single-crystal CVD diamond”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:13 (2020), 19–23 ; Tech. Phys. Lett., 46:7 (2020), 641–645 |
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12. |
M. N. Drozdov, E. A. Arkhipova, Yu. N. Drozdov, S. A. Kraev, V. I. Shashkin, A. E. Parafin, M. A. Lobaev, A. L. Vikharev, A. M. Gorbachev, D. B. Radishev, V. A. Isaev, S. A. Bogdanov, “The use of pulsed laser annealing to form ohmic Mo/Ti contacts to diamond”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:11 (2020), 34–38 ; Tech. Phys. Lett., 46:6 (2020), 551–555 |
2
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13. |
M. N. Drozdov, Yu. N. Drozdov, A. I. Okhapkin, P. A. Yunin, O. A. Streletskii, A. E. Ieshkin, “SIMS analysis of carbon-containing materials: content of carbon atoms in $sp^{2}$ and $sp^{3}$ hybridization states”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:6 (2020), 38–42 ; Tech. Phys. Lett., 46:3 (2020), 290–294 |
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2019 |
14. |
M. N. Drozdov, E. V. Demidov, Yu. N. Drozdov, S. A. Kraev, V. I. Shashkin, E. A. Arkhipova, M. A. Lobaev, A. L. Vikharev, A. M. Gorbachev, D. B. Radishev, V. A. Isaev, S. A. Bogdanov, “Formation of low-resistivity Au/Mo/Ti ohmic contacts to $p$-diamond epitaxial layers”, Zhurnal Tekhnicheskoi Fiziki, 89:12 (2019), 1923–1932 ; Tech. Phys., 64:12 (2019), 1827–1836 |
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15. |
E. A. Arkhipova, E. V. Demidov, M. N. Drozdov, S. A. Kraev, V. I. Shashkin, M. A. Lobaev, A. L. Vikharev, A. M. Gorbachev, D. B. Radishev, V. A. Isaev, S. A. Bogdanov, “Ohmic contacts to CVD diamond with boron-doped $\delta$ layers”, Fizika i Tekhnika Poluprovodnikov, 53:10 (2019), 1386–1390 ; Semiconductors, 53:10 (2019), 1348–1352 |
1
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16. |
A. V. Novikov, D. V. Yurasov, N. A. Baidakova, P. A. Bushuikin, B. A. Andreev, P. A. Yunin, M. N. Drozdov, A. N. Yablonskii, M. A. Kalinnikov, Z. F. Krasil'nik, “Comparative analysis of luminescence properties of Ge : Sb layers grown on Ge(001) and Si(001) substrates”, Fizika i Tekhnika Poluprovodnikov, 53:10 (2019), 1354–1359 ; Semiconductors, 53:10 (2019), 1318–1323 |
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17. |
A. I. Okhapkin, P. A. Yunin, M. N. Drozdov, S. Korolev, S. A. Kraev, E. A. Arkhipova, E. V. Skorokhodov, P. A. Bushuikin, V. I. Shashkin, “Plasma-chemical deposition of diamond-like films onto the surface of heavily doped single-crystal diamond”, Fizika i Tekhnika Poluprovodnikov, 53:9 (2019), 1229–1232 ; Semiconductors, 53:9 (2019), 1203–1206 |
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18. |
D. V. Yurasov, N. A. Baidakova, M. N. Drozdov, E. E. Morozova, M. A. Kalinnikov, A. V. Novikov, “Influence of annealing on the properties of Ge:Sb/Si(001) layers with an antimony concentration above its equilibrium solubility in germanium”, Fizika i Tekhnika Poluprovodnikov, 53:7 (2019), 897–902 ; Semiconductors, 53:7 (2019), 882–886 |
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19. |
M. N. Drozdov, Yu. N. Drozdov, A. I. Okhapkin, S. A. Kraev, M. A. Lobaev, “A new approach to tof-sims analysis of the phase composition of carbon-containing materials”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:2 (2019), 50–54 ; Tech. Phys. Lett., 45:1 (2019), 48–52 |
6
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20. |
A. E. Ieshkin, A. B. Tolstoguzov, S. E. Svyakhovskii, M. N. Drozdov, V. O. Pelenovich, “Experimental observation of the confinement of atomic collision cascades during ion sputtering of porous silicon”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:2 (2019), 39–42 ; Tech. Phys. Lett., 45:1 (2019), 37–40 |
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2018 |
21. |
M. V. Sapozhnikov, O. V. Ermolaeva, E. V. Skorokhodov, N. S. Gusev, M. N. Drozdov, “Magnetic skyrmions in thickness-modulated films”, Pis'ma v Zh. Èksper. Teoret. Fiz., 107:6 (2018), 378–382 ; JETP Letters, 107:6 (2018), 364–368 |
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22. |
A. I. Okhapkin, P. A. Yunin, M. N. Drozdov, S. A. Kraev, E. V. Skorokhodov, V. I. Shashkin, “Plasma chemical etching of gallium arsenide in C$_{2}$F$_{5}$Cl-based inductively coupled plasma”, Fizika i Tekhnika Poluprovodnikov, 52:11 (2018), 1362–1365 ; Semiconductors, 52:11 (2018), 1473–1476 |
1
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23. |
M. N. Drozdov, Yu. N. Drozdov, A. V. Novikov, P. A. Yunin, D. V. Yurasov, “A new limitation of the depth resolution in tof-sims elemental profiling: the influence of a probing ion beam”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:8 (2018), 11–19 ; Tech. Phys. Lett., 44:4 (2018), 320–323 |
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24. |
M. N. Drozdov, Yu. N. Drozdov, M. A. Lobaev, P. A. Yunin, “New cluster secondary ions for quantitative analysis of the concentration of boron atoms in diamond by time-of-flight secondary-ion mass spectrometry”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 44:7 (2018), 52–60 ; Tech. Phys. Lett., 44:4 (2018), 297–300 |
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2017 |
25. |
D. V. Yurasov, M. N. Drozdov, V. B. Shmagin, A. V. Novikov, “Antimony segregation in Si layers grown by molecular beam epitaxy on Si wafers with different crystallographic orientations”, Fizika i Tekhnika Poluprovodnikov, 51:12 (2017), 1611–1615 ; Semiconductors, 51:12 (2017), 1552–1556 |
26. |
A. I. Okhapkin, S. Korolev, P. A. Yunin, M. N. Drozdov, S. A. Kraev, O. I. Khrykin, V. I. Shashkin, “Low-temperature deposition of SiN$_ x$ films in SiH$_{4}$/Ar + N$_{2}$ inductively coupled plasma under high silane dilution with argon”, Fizika i Tekhnika Poluprovodnikov, 51:11 (2017), 1503–1506 ; Semiconductors, 51:11 (2017), 1449–1452 |
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27. |
I. L. Kalentyeva, O. V. Vikhrova, Yu. A. Danilov, B. N. Zvonkov, A. V. Kudrin, M. V. Dorokhin, D. A. Pavlov, I. N. Antonov, M. N. Drozdov, Yu. V. Usov, “Features of the selective manganese doping of GaAs structures”, Fizika i Tekhnika Poluprovodnikov, 51:11 (2017), 1468–1472 ; Semiconductors, 51:11 (2017), 1415–1419 |
1
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28. |
E. A. Surovegina, E. V. Demidov, M. N. Drozdov, A. V. Murel, O. I. Khrykin, V. I. Shashkin, M. A. Lobaev, A. M. Gorbachev, A. L. Viharev, S. A. Bogdanov, V. A. Isaev, A. B. Muchnikov, V. V. Chernov, D. B. Radishev, J. E. Batler, “Erratum to: “Atomic composition and electrical characteristics of epitaxial CVD diamond layers doped with boron””, Fizika i Tekhnika Poluprovodnikov, 51:8 (2017), 1151 ; Semiconductors, 51:8 (2017), 1106 |
29. |
M. N. Drozdov, V. M. Daniltsev, Yu. N. Drozdov, O. I. Khrykin, P. A. Yunin, “Selective analysis of the elemental composition of InGaAs/GaAs nanoclusters by secondary ion mass spectrometry”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 43:10 (2017), 50–59 ; Tech. Phys. Lett., 43:5 (2017), 477–480 |
1
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2016 |
30. |
E. A. Surovegina, E. V. Demidov, M. N. Drozdov, A. V. Murel, O. I. Khrykin, V. I. Shashkin, M. A. Lobaev, A. M. Gorbachev, A. L. Vikharev, S. A. Bogdanov, V. A. Isaev, A. B. Muchnikov, V. V. Chernov, D. B. Radishev, D. E. Batler, “Atomic composition and electrical characteristics of epitaxial CVD diamond layers doped with boron”, Fizika i Tekhnika Poluprovodnikov, 50:12 (2016), 1595–1598 ; Semiconductors, 50:12 (2016), 1569–1573 |
2
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31. |
D. N. Lobanov, A. V. Novikov, P. A. Yunin, E. V. Skorokhodov, M. V. Shaleev, M. N. Drozdov, O. I. Khrykin, O. A. Buzanov, V. V. Alenkov, P. I. Folomin, A. B. Gritsenko, “Epitaxial GaN layers formed on langasite substrates by the plasma-assisted MBE method”, Fizika i Tekhnika Poluprovodnikov, 50:11 (2016), 1532–1536 ; Semiconductors, 50:11 (2016), 1511–1514 |
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32. |
I. L. Kalentyeva, O. V. Vikhrova, Yu. A. Danilov, B. N. Zvonkov, A. V. Kudrin, M. N. Drozdov, “Effect of thermal annealing on the photoluminescence of structures with InGaAs/GaAs quantum wells and a low-temperature GaAs layer $\delta$-doped with Mn”, Fizika i Tekhnika Poluprovodnikov, 50:11 (2016), 1490–1496 ; Semiconductors, 50:11 (2016), 1469–1474 |
3
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33. |
V. M. Daniltsev, E. V. Demidov, M. N. Drozdov, Yu. N. Drozdov, S. A. Kraev, E. A. Surovegina, V. I. Shashkin, P. A. Yunin, “Heavily doped GaAs:Te layers grown by MOVPE using diisopropyl telluride as a source”, Fizika i Tekhnika Poluprovodnikov, 50:11 (2016), 1459–1462 ; Semiconductors, 50:11 (2016), 1439–1442 |
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34. |
V. Ya. Aleshkin, A. A. Dubinov, K. E. Kudryavtsev, P. A. Yunin, M. N. Drozdov, O. V. Vikhrova, S. M. Nekorkin, B. N. Zvonkov, “Stimulated emission from a metamorphic GaAsSb bulk layer on a GaAs substrate”, Fizika i Tekhnika Poluprovodnikov, 50:5 (2016), 596–599 ; Semiconductors, 50:5 (2016), 586–589 |
35. |
A. P. Detochenko, S. A. Denisov, M. N. Drozdov, A. I. Mashin, V. A. Gavva, A. D. Bulanov, A. V. Nezhdanov, A. A. Ezhevskii, M. V. Stepikhova, V. Yu. Chalkov, V. N. Trushin, D. V. Shengurov, V. G. Shengurov, N. V. Abrosimov, H. Riemann, “Epitaxially grown monoisotopic Si, Ge, and Si$_{1-x}$Ge$_{x}$ alloy layers: production and some properties”, Fizika i Tekhnika Poluprovodnikov, 50:3 (2016), 350–353 ; Semiconductors, 50:3 (2016), 345–348 |
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36. |
M. N. Drozdov, Yu. N. Drozdov, P. A. Yunin, P. I. Folomin, A. B. Gritsenko, V. L. Kryukov, E. V. Kryukov, “Extremely deep profiling analysis of the atomic composition of thick ($>$ 100 $\mu$m) GaAs layers within power PIN diodes by secondary ion mass spectrometry”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:15 (2016), 27–35 ; Tech. Phys. Lett., 42:8 (2016), 783–787 |
37. |
M. N. Drozdov, Yu. N. Drozdov, A. V. Novikov, P. A. Yunin, D. V. Yurasov, “Nonlinear calibration curves in secondary ion mass spectrometry for quantitative analysis of gesi heterostructures with nanoclusters”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:5 (2016), 40–48 ; Tech. Phys. Lett., 42:3 (2016), 243–247 |
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2009 |
38. |
P. G. Sennikov, S. V. Golubev, V. I. Shashkin, D. A. Pryakhin, M. N. Drozdov, B. A. Andreev, Yu. N. Drozdov, A. S. Kuznetsov, H. Pol, “Production of nanocrystalline silicon layers using the plasma enhanced chemical vapor deposition from the gas phase of silicon tetrafluoride”, Pis'ma v Zh. Èksper. Teoret. Fiz., 89:2 (2009), 80–83 ; JETP Letters, 89:2 (2009), 73–75 |
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2003 |
39. |
A. A. Andronov, M. N. Drozdov, D. I. Zinchenko, A. A. Marmalyuk, I. M. Nefedov, Yu. N. Nozdrin, A. A. Padalitsa, A. V. Sosnin, A. V. Ustinov, V. I. Shashkin, “Transport in weak barrier superlattices and the problem of the terahertz Bloch oscillator”, UFN, 173:7 (2003), 780–783 ; Phys. Usp., 46:7 (2003), 755–758 |
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