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Publications in Math-Net.Ru |
Citations |
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2022 |
| 1. |
L. I. Goray, T. N. Berezovskaya, D. V. Mokhov, V. A. Sharov, K. Yu. Shubina, E. V. Pirogov, A. S. Dashkov, A. V. Nashchekin, M. V. Zorina, M. M. Barysheva, S. A. Garakhin, S. Yu. Zuev, N. I. Chkhalo, “Fabrication and testing of Au- and multilayer Mo/Si-coated diffraction gratings with high-order brilliance in high orders in the soft X-ray and EUV ranges”, Kvantovaya Elektronika, 52:10 (2022), 955–962  [Bull. Lebedev Physics Institute, 50:suppl. 2 (2023), S250–S261] |
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2021 |
| 2. |
S. A. Garakhin, I. G. Zabrodin, S. Yu. Zuev, A. Ya. Lopatin, A. N. Nechai, A. E. Pestov, A. A. Perekalov, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko, R. M. Smertin, N. N. Tsybin, N. I. Chkhalo, “Measurements of the absolute values of the radiation intensity in the wavelength range of 6.6–32 nm of stainless steel targets with pulsed laser excitation”, Zhurnal Tekhnicheskoi Fiziki, 91:10 (2021), 1448–1453  |
| 3. |
A. V. Vodopyanov, S. A. Garakhin, I. G. Zabrodin, S. Yu. Zuev, A. Ya. Lopatin, A. N. Nechai, A. E. Pestov, A. A. Perekalov, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko, R. M. Smertin, B. A. Ulasevich, N. I. Chkhalo, “Measurements of the absolute intensities of spectral lines of Kr, Ar, and O ions in the wavelength range of 10–18 nm under pulsed laser excitation”, Kvantovaya Elektronika, 51:8 (2021), 700–707 [Quantum Electron., 51:8 (2021), 700–707   ] |
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2020 |
| 4. |
S. A. Garakhin, M. M. Barysheva, E. A. Vishnyakov, S. Yu. Zuev, A. S. Kirichenko, S. V. Kuzin, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo, “Broadband mirrors for spectroheliographs at the KORTES sun study facility”, Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020), 1876–1883 ; Tech. Phys., 65:11 (2020), 1792–1799 |
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| 5. |
R. S. Pleshkov, S. Yu. Zuev, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo, P. Jonnard, “The smoothing effect of si layers in multilayer Be/Al mirrors for the 17- to 31-nm range”, Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020), 1870–1875 ; Tech. Phys., 65:11 (2020), 1786–1791 |
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| 6. |
S. A. Garakhin, M. V. Zorina, S. Yu. Zuev, M. S. Mikhailenko, A. E. Pestov, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko, N. I. Chkhalo, “Modification and polishing of the holographic diffraction grating grooves by a neutralized Ar ion beam”, Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020), 1864–1869 ; Tech. Phys., 65:11 (2020), 1780–1785 |
| 7. |
M. M. Barysheva, S. Yu. Zuev, A. Ya. Lopatin, V. I. Luchin, A. E. Pestov, N. N. Salashchenko, N. N. Tsybin, N. I. Chkhalo, “Prospects for the use of X-ray tubes with a field-emission cathode and a through-type anode in the range of soft X-ray radiation”, Zhurnal Tekhnicheskoi Fiziki, 90:11 (2020), 1806–1816 ; Tech. Phys., 65:11 (2020), 1726–1735 |
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2019 |
| 8. |
R. M. Smertin, S. A. Garakhin, S. Yu. Zuev, A. N. Nechai, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, M. G. Sertsu, A. Sokolov, N. I. Chkhalo, F. Schäfers, P. A. Yunin, “Influence of thermal annealing on the properties of multilayer Mo/Be mirrors”, Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1783–1788 ; Tech. Phys., 64:11 (2019), 1692–1697 |
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| 9. |
S. Yu. Zuev, R. S. Pleshkov, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo, F. Schäfers, M. G. Sertsu, A. Sokolov, “Influence of beryllium barrier layers on the properties of Mo/Si multilayer mirrors”, Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1779–1782 ; Tech. Phys., 64:11 (2019), 1688–1691 |
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| 10. |
D. S. Kvashennikov, S. Yu. Zuev, V. N. Polkovnikov, N. N. Salashchenko, N. I. Chkhalo, F. Delmotte, E. Meltchakov, “Multilayer Ag/Y mirrors for the spectral range of 9–11 nm”, Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1774–1778 ; Tech. Phys., 64:11 (2019), 1684–1687 |
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| 11. |
M. M. Barysheva, S. A. Garakhin, S. Yu. Zuev, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, R. M. Smertin, N. I. Chkhalo, E. Meltchakov, “Optimization of composition, synthesis, and study of broadband multilayer mirrors for the EUV spectral range”, Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1763–1769 ; Tech. Phys., 64:11 (2019), 1673–1679 |
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| 12. |
S. Yu. Zuev, A. Ya. Lopatin, V. I. Luchin, N. N. Salashchenko, D. A. Tatarskii, N. N. Tsybin, N. I. Chkhalo, “Optical, mechanical, and thermal properties of free-standing MoSi$_{2}$N$_{x}$ è ZrSi$_{2}$N$_{y}$ nanocomposite films”, Zhurnal Tekhnicheskoi Fiziki, 89:11 (2019), 1680–1685 ; Tech. Phys., 64:11 (2019), 1590–1595 |
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| 13. |
V. N. Polkovnikov, N. I. Chkhalo, E. Meltchakov, F. Delmotte, S. Yu. Zuev, N. N. Salashchenko, M. V. Svechnikov, N. N. Tsybin, “Stable multilayer reflective coatings for $\lambda$(HeI) = 58.4 nm for the kortes solar telescope”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:3 (2019), 26–29 ; Tech. Phys. Lett., 45:2 (2019), 85–88 |
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| 14. |
M. M. Barysheva, S. A. Garakhin, S. Yu. Zuev, V. N. Polkovnikov, N. N. Salashchenko, M. V. Svechnikov, N. I. Chkhalo, S. Yulin, “Comparison of approaches in the manufacture of broadband mirrors for the EUV range: aperiodic and stack structures”, Kvantovaya Elektronika, 49:4 (2019), 380–385 [Quantum Electron., 49:4 (2019), 380–385 ] |
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2018 |
| 15. |
P. S. Butorin, Yu. M. Zadiranov, S. Yu. Zuev, S. G. Kalmykov, V. N. Polkovnikov, M. È. Sasin, N. I. Chkhalo, “Absolutely calibrated spectrally resolved measurements of Xe laser plasma radiation intensity in the EUV range”, Zhurnal Tekhnicheskoi Fiziki, 88:10 (2018), 1554–1558 ; Tech. Phys., 63:10 (2018), 1507–1510 |
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2017 |
| 16. |
S. A. Garakhin, I. G. Zabrodin, S. Yu. Zuev, I. A. Kas'kov, A. Ya. Lopatin, A. N. Nechai, V. N. Polkovnikov, N. N. Salashchenko, N. N. Tsybin, N. I. Chkhalo, M. V. Svechnikov, “Laboratory reflectometer for the investigation of optical elements in a wavelength range of 5 – 50 nm: description and testing results”, Kvantovaya Elektronika, 47:4 (2017), 385–392 [Quantum Electron., 47:4 (2017), 385–392 ] |
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2016 |
| 17. |
M. V. Zorina, S. Yu. Zuev, M. S. Mikhailenko, A. E. Pestov, V. N. Polkovnikov, N. N. Salashchenko, N. I. Chkhalo, “The diffraction efficiency of echelle gratings increased by ion-beam polishing of groove surfaces”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:16 (2016), 34–40 ; Tech. Phys. Lett., 42:8 (2016), 844–847 |
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