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Publications in Math-Net.Ru |
Citations |
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2021 |
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V. N. Kruchinin, D. S. Odintsov, L. A. Shundrin, I. K. Shundrina, S. V. Rykhlitskii, E. V. Spesivtsev, V. A. Gritsenko, “Optical and electrochromic properties of thin films of ambipolar polyimides with pendant groups based on thioxanthenone derivatives”, Optics and Spectroscopy, 129:11 (2021), 1393–1399 ; Optics and Spectroscopy, 130:14 (2022), 2114–2119 |
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M. V. Kruchinina, A. A. Gromov, L. V. Shcherbakova, E. V. Kruchinina, V. M. Generalov, K. V. Generalov, V. N. Kruchinin, S. V. Rykhlitskii, I. N. Yakovina, M. V. Yakovlev, O. V. Minin, I. V. Minin, “Electrical and viscoelastic parameters of red blood cells in models for the diagnosis of adenomatous polyps and stages of colorectal cancer with optical detection of cells in non-uniform alternating electric field”, Optics and Spectroscopy, 129:6 (2021), 684–697 ; Optics and Spectroscopy, 129:12 (2021), 1327–1340 |
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V. N. Kruchinin, V. A. Volodin, S. V. Rykhlitskii, V. A. Gritsenko, I. P. Posvirin, Xiaoping Shi, M. R. Baklanov, “Atomic structure and optical properties of plasma enhanced chemical vapor deposited SiCOH Low-k dielectric film”, Optics and Spectroscopy, 129:5 (2021), 618 ; Optics and Spectroscopy, 129:6 (2021), 645–651 |
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V. A. Shvets, D. V. Marin, M. V. Yakushev, S. V. Rykhlitskii, “Investigation of the temperature dependence of the spectra of optical constants of Hg$_{1-x}$Cd$_{x}$Te films grown using molecular beam epitaxy”, Optics and Spectroscopy, 129:1 (2021), 33–40 ; Optics and Spectroscopy, 129:1 (2021), 29–36 |
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V. A. Shvets, D. V. Marin, I. A. Azarov, M. V. Yakushev, S. V. Rykhlitskii, “In situ ellipsometric monitoring of composition and temperature of HgCdTe layers during their growth”, Fizika i Tekhnika Poluprovodnikov, 55:12 (2021), 1240–1247 |
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2020 |
6. |
T. V. Perevalov, V. N. Kruchinin, S. V. Rykhlitskii, V. A. Gritsenko, A. P. Eliseev, E. E. Lomonova, “Optical properties of (ZrO$_{2}$)$_{1-x}$(Y$_{2}$O$_{3}$)$_{x}$ ($x$ = 0–0.037) crystals grown by directional crystallization of the melt”, Optics and Spectroscopy, 128:12 (2020), 1830–1836 ; Optics and Spectroscopy, 128:12 (2020), 1963–1969 |
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V. A. Shvets, D. V. Marin, V. G. Remesnik, I. A. Azarov, M. V. Yakushev, S. V. Rykhlitskii, “Parametric model of the optical constant spectra of Hg$_{1-x}$Cd$_{x}$Te and determination of the compound composition”, Optics and Spectroscopy, 128:12 (2020), 1815–1820 ; Optics and Spectroscopy, 128:12 (2020), 1948–1953 |
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2019 |
8. |
V. N. Kruchinin, T. V. Perevalov, G. N. Kamaev, S. V. Rykhlitskii, V. A. Gritsenko, “Optical properties of nonstoichiometric silicon oxide SiO$_{x}$ ($x<$ 2)”, Optics and Spectroscopy, 127:5 (2019), 769–773 ; Optics and Spectroscopy, 127:5 (2019), 836–840 |
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V. N. Kruchinin, M. V. Kruchinina, Ya. I. Prudnikova, E. V. Spesivtsev, S. V. Rykhlitskii, V. A. Volodin, S. V. Shekhovtsov, S. E. Pel'tek, “The use of spectral ellipsometry and Raman spectroscopy in the screening diagnosis of colorectal cancer”, Optics and Spectroscopy, 127:1 (2019), 170–176 ; Optics and Spectroscopy, 127:1 (2019), 170–176 |
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10. |
V. A. Shvets, I. A. Azarov, D. V. Marin, M. V. Yakushev, S. V. Rykhlitskii, “Ellipsometric method for measuring the CdTe buffer-layer temperature in the molecular-beam epitaxy of CdHgTe”, Fizika i Tekhnika Poluprovodnikov, 53:1 (2019), 137–142 ; Semiconductors, 53:1 (2019), 132–137 |
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2018 |
11. |
V. N. Kruchinin, D. D. Klyamer, E. V. Spesivtsev, S. V. Rykhlitskii, T. V. Basova, “Optical properties of thin films of zinc phthalocyanines determined by spectroscopic ellipsometry”, Optics and Spectroscopy, 125:6 (2018), 825–829 ; Optics and Spectroscopy, 125:6 (2018), 1019–1024 |
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