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Publications in Math-Net.Ru |
Citations |
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2024 |
| 1. |
V. V. Lider, “X-ray refraction introscopy”, UFN, 194:4 (2024), 345–359  ; Phys. Usp., 67:4 (2024), 325–337  |
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2023 |
| 2. |
V. V. Lider, “Talbot and Talbot–Lau X-ray interferometers”, UFN, 193:10 (2023), 1047–1070 ; Phys. Usp., 66:10 (2023), 987–1007  |
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2021 |
| 3. |
V. V. Lider, “X-ray diffraction topography methods (review)”, Fizika Tverdogo Tela, 63:2 (2021), 165–190  ; Phys. Solid State, 63:2 (2021), 189–214 |
11
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| 4. |
V. V. Lider, “Focusing capillar and porous X-ray optics”, Optics and Spectroscopy, 129:11 (2021), 1444–1460 ; Optics and Spectroscopy, 130:14 (2022), 2156–2170 |
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2020 |
| 5. |
V. V. Lider, “Precise determination of crystal lattice parameters”, UFN, 190:9 (2020), 971–994 ; Phys. Usp., 63:9 (2020), 907–928 |
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2019 |
| 6. |
V. V. Lider, “Multilayer X-ray interference structures”, UFN, 189:11 (2019), 1137–1171 ; Phys. Usp., 62:11 (2019), 1063–1095 |
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2018 |
| 7. |
V. V. Lider, “X-ray fluorescence imaging”, UFN, 188:10 (2018), 1081–1102 ; Phys. Usp., 61:10 (2018), 980–999 |
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2017 |
| 8. |
V. V. Lider, “X-ray microscopy”, UFN, 187:2 (2017), 201–219 ; Phys. Usp., 60:2 (2017), 187–203 |
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2015 |
| 9. |
V. V. Lider, “X-ray holography”, UFN, 185:4 (2015), 393–413 ; Phys. Usp., 58:4 (2015), 365–383 |
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2014 |
| 10. |
V. V. Lider, “X-ray crystal interferometers”, UFN, 184:11 (2014), 1217–1236 ; Phys. Usp., 57:11 (2014), 1099–1117 |
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1989 |
| 11. |
V. V. Lider, F. N. Chukhovskii, Yu. P. Khapachev, M. N. Barashev, “X-ray diffraction study of distorted surface layers of $\mathrm{Si} (111)$ and $\mathrm{In}_{0.5}\mathrm{Ga}_{0.5}\mathrm{P}/\mathrm{GaAs} (111)$ basing on the constant strain gradient model”, Fizika Tverdogo Tela, 31:4 (1989), 74–81 |
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1972 |
| 12. |
A. N. Kornev, B. A. Maksimov, V. V. Lider, V. V. Ilyukhin, N. V. Belov, “Crystalline structure of $\mathrm{Na}_2\mathrm{Cu}[\mathrm{Si}_4\mathrm{O}_{10}]$”, Dokl. Akad. Nauk SSSR, 205:4 (1972), 831–833 |
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