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This article is cited in 7 scientific papers (total in 8 papers)
REVIEWS OF TOPICAL PROBLEMS
Precise determination of crystal lattice parameters
V. V. Lider Federal Scientific Research Center Crystallography and Photonics, Shubnikov Institute for Cristallography, Russian Academy of Sciences, Moscow
Abstract:
Precision X-ray methods for absolute and relative determination of crystal lattice parameters (interplanar distances) are described and compared, including the X-ray divergent-beam (Kossel) technique, the Bond method, the Renninger method, the back reflection method, the interference method, and the method of standards. It is shown that for most of the considered methods, a relative accuracy of $\sim 10 ^{-5}-10^{-6}$ for determining the lattice parameters is usually achievable, with the last two methods giving a much greater accuracy, at the level of $\sim 10 ^{-8}-10^{-9}$.
Received: May 14, 2019 Revised: July 1, 2019 Accepted: July 2, 2019
Citation:
V. V. Lider, “Precise determination of crystal lattice parameters”, UFN, 190:9 (2020), 971–994; Phys. Usp., 63:9 (2020), 907–928
Linking options:
https://www.mathnet.ru/eng/ufn6553 https://www.mathnet.ru/eng/ufn/v190/i9/p971
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