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This article is cited in 14 scientific papers (total in 14 papers)
INSTRUMENTS AND METHODS OF INVESTIGATION
X-ray crystal interferometers
V. V. Lider Shubnikov Institute of Cristallography, Russian Academy of Sciences, Moscow
Abstract:
Various configurations of the X-ray crystal interferometer are reviewed. The interferometer applications considered include metrology, the measurement of fundamental physical constants, the study of weakly absorbing phase objects, time-resolved diagnostics, the determination of hard X-ray beam parameters, and the characterization of structural defects in the context of developing an X-ray Michelson interferometer. The three-crystal Laue interferometer (LLL-interferometer), its design, and the experimental opportunities it offers are given particular attention.
Received: October 28, 2013 Revised: December 27, 2013 Accepted: December 27, 2013
Citation:
V. V. Lider, “X-ray crystal interferometers”, UFN, 184:11 (2014), 1217–1236; Phys. Usp., 57:11 (2014), 1099–1117
Linking options:
https://www.mathnet.ru/eng/ufn4843 https://www.mathnet.ru/eng/ufn/v184/i11/p1217
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Abstract page: | 307 | Full-text PDF : | 102 | References: | 35 |
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