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Uspekhi Fizicheskikh Nauk, 2014, Volume 184, Number 11, Pages 1217–1236
DOI: https://doi.org/10.3367/UFNr.0184.201411e.1217 (Mi ufn4843) 		 
This article is cited in 15 scientific papers (total in 15 papers)

INSTRUMENTS AND METHODS OF INVESTIGATION

X-ray crystal interferometers

V. V. Lider

Shubnikov Institute of Cristallography, Russian Academy of Sciences, Moscow
Full-text PDF (1265 kB) Citations (15)
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DOI: https://doi.org/10.3367/UFNr.0184.201411e.1217
Abstract: Various configurations of the X-ray crystal interferometer are reviewed. The interferometer applications considered include metrology, the measurement of fundamental physical constants, the study of weakly absorbing phase objects, time-resolved diagnostics, the determination of hard X-ray beam parameters, and the characterization of structural defects in the context of developing an X-ray Michelson interferometer. The three-crystal Laue interferometer (LLL-interferometer), its design, and the experimental opportunities it offers are given particular attention.
Received: October 28, 2013
Revised: December 27, 2013
Accepted: December 27, 2013
English version:
Physics–Uspekhi, 2014, Volume 57, Issue 11, Pages 1099–1117
DOI: https://doi.org/10.3367/UFNe.0184.201411e.1217
Bibliographic databases:
Document Type: Article
PACS: 07.85.-m, 41.50.+h, 61.05.cp
Language: Russian
Citation: V. V. Lider, “X-ray crystal interferometers”, UFN, 184:11 (2014), 1217–1236; Phys. Usp., 57:11 (2014), 1099–1117
Citation in format AMSBIB
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    • This publication is cited in the following 15 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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