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This article is cited in 11 scientific papers (total in 11 papers)
Reviews
X-ray diffraction topography methods (review)
V. V. Lider FSRC "Crystallography and Photonics" RAS, Moscow, Russia
Abstract:
The review describes various X-ray diffraction methods for visualizing defects in the crystal lattice, discusses the formation of diffraction contrast, and gives examples of the use of X-ray topography to study various structural defects of the crystal lattice.
Keywords:
X-rays, diffraction, topography, diffraction contrast.
Received: 08.10.2020 Revised: 08.10.2020 Accepted: 20.10.2020
Citation:
V. V. Lider, “X-ray diffraction topography methods (review)”, Fizika Tverdogo Tela, 63:2 (2021), 165–190; Phys. Solid State, 63:2 (2021), 189–214
Linking options:
https://www.mathnet.ru/eng/ftt8173 https://www.mathnet.ru/eng/ftt/v63/i2/p165
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Statistics & downloads: |
Abstract page: | 69 | Full-text PDF : | 22 |
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