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Publications in Math-Net.Ru |
Citations |
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2021 |
| 1. |
N. I. Stas’kov, A. B. Sotski, L. I. Sotskaya, N. V. Gaponenko, E. I. Lashkovskaya, A. N. Pyatlitski, A. A. Kozlov, “Optical characteristics of a europium-doped barium titanate inhomogeneous layer”, Optics and Spectroscopy, 129:4 (2021), 506–511   ; Optics and Spectroscopy, 129:5 (2021), 586–591 |
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2020 |
| 2. |
A. B. Sotski, S. S. Mikheev, N. I. Stas’kov, L. I. Sotskaya, “Spectrophotometry of layers on plane parallel substrates”, Optics and Spectroscopy, 128:8 (2020), 1133–1143 ; Optics and Spectroscopy, 128:8 (2020), 1155–1166 |
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2018 |
| 3. |
N. I. Stas’kov, A. B. Sotski, L. I. Sotskaya, I. V. Ivashkevich, A. I. Kulak, N. V. Gaponenko, M. V. Rudenko, A. N. Pyatlitski, “Optical characteristics of strontium titanate films obtained by the sol–gel method”, Optics and Spectroscopy, 125:4 (2018), 473–478 ; Optics and Spectroscopy, 125:4 (2018), 492–498 |
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2015 |
| 4. |
N. I. Stas'kov, “The analytical solution of the inverse problem for the spectrophotometric transparent layer on an absorbing substrate”, PFMT, 2015, no. 4(25), 31–37 |
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N. I. Staskov, S. O. Parashkov, A. V. Shylov, N. A. Krekoten, “Analytical solution of the inverse problem of a spectrophotometer absorbing layer on an absorbing substrate with a dielectric layer”, PFMT, 2015, no. 3(24), 33–37 |
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2013 |
| 6. |
N. I. Stas’kov, I. V. Ivashkevich, N. A. Krekoten, “Ellipsometry of the transitive layers semiconductor–dielectric”, PFMT, 2013, no. 2(15), 18–24 |
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2012 |
| 7. |
N. I. Stas’kov, I. V. Ivashkevich, A. B. Sotski, L. I. Sotskaya, “The account of influence of the natural surface layer under investigation of silicon plates by the method
of spectral ellipsometry”, PFMT, 2012, no. 1(10), 26–30 |
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