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Publications in Math-Net.Ru |
Citations |
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2021 |
| 1. |
N. K. Maksimova, B. O. Kushnarev, L. S. Khludkova, A. A. Birykov, E. Yu. Sevastyanov, E. V. Chernikov, “The stability of liquid hydrocarbon vapor sensors based on SnO$_{2}$ thin films modified with various catalysts”, Zhurnal Tekhnicheskoi Fiziki, 91:7 (2021), 1164–1173   ; Tech. Phys., 66:8 (2021), 999–1008  |
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| 2. |
A. V. Almaev, V. I. Nikolaev, S. I. Stepanov, N. N. Yakovlev, A. I. Pechnikov, E. V. Chernikov, B. O. Kushnarev, “Effect of ambient humidity on the electrical conductive properties of polymorphic Ga$_{2}$O$_{3}$ structures”, Fizika i Tekhnika Poluprovodnikov, 55:3 (2021), 269–276 ; Semiconductors, 55:3 (2021), 346–353 |
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2020 |
| 3. |
A. V. Almaev, B. O. Kushnarev, E. V. Chernikov, V. À. Novikov, “Synthesis and gas sensitivity of thin chromium oxide films”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:20 (2020), 35–37 ; Tech. Phys. Lett., 46:10 (2020), 1028–1031 |
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S. N. Nesov, P. M. Korusenko, V. V. Bolotov, K. E. Ivlev, E. V. Chernikov, S. N. Povoroznyuk, “Functionalization of multiwalled carbon nanotubes by an ion beam to increase the interfacial adhesion in tin oxide composites”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:15 (2020), 25–28 ; Tech. Phys. Lett., 46:8 (2020), 752–755 |
| 5. |
A. V. Tsymbalov, V. M. Kalygina, N. K. Maksimova, E. V. Chernikov, “The effect of operating modes on the response of ammonia sensors based on tin dioxide films”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:10 (2020), 21–24 ; Tech. Phys. Lett., 46:5 (2020), 480–483 |
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2019 |
| 6. |
V. M. Kalygina, T. Z. Lygdenova, Yu. S. Petrova, E. V. Chernikov, “Influence of the substrate material on the properties of gallium-oxide films and gallium-oxide-based structures”, Fizika i Tekhnika Poluprovodnikov, 53:4 (2019), 468–473 ; Semiconductors, 53:4 (2019), 452–457 |
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A. V. Almaev, N. N. Yakovlev, E. V. Chernikov, O. P. Tolbanov, “Selective sensors of nitrogen dioxide based on thin tungsten oxide films under optical irradiation”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 45:20 (2019), 7–10 ; Tech. Phys. Lett., 45:10 (2019), 1016–1019 |
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