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Publications in Math-Net.Ru |
Citations |
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2021 |
| 1. |
A. B. Sotski, M. M. Nazarov, S. S. Mikheev, L. I. Sotskaya, “Sensitivity of reflecting terahertz sensors of aqueous solutions”, Zhurnal Tekhnicheskoi Fiziki, 91:2 (2021), 315–325   ; Tech. Phys., 66:2 (2021), 305–315  |
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| 2. |
A. B. Sotski, E. A. Chudakov, L. I. Sotskaya, “Ellipsometry of metallic films under the conditions of the anomalous skin effect”, Optics and Spectroscopy, 129:7 (2021), 889–898 ; Optics and Spectroscopy, 129:9 (2021), 1023–1032 |
| 3. |
N. I. Stas’kov, A. B. Sotski, L. I. Sotskaya, N. V. Gaponenko, E. I. Lashkovskaya, A. N. Pyatlitski, A. A. Kozlov, “Optical characteristics of a europium-doped barium titanate inhomogeneous layer”, Optics and Spectroscopy, 129:4 (2021), 506–511 ; Optics and Spectroscopy, 129:5 (2021), 586–591 |
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2020 |
| 4. |
A. B. Sotski, S. S. Mikheev, N. I. Stas’kov, L. I. Sotskaya, “Spectrophotometry of layers on plane parallel substrates”, Optics and Spectroscopy, 128:8 (2020), 1133–1143 ; Optics and Spectroscopy, 128:8 (2020), 1155–1166 |
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| 5. |
S. S. Miheev, A. B. Sotsky, M. M. Nazarov, L. I. Sotskaya, “Calculation of the waveguide probe for terahertz spectroscopy of a layered medium”, PFMT, 2020, no. 1(42), 55–60 |
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2018 |
| 6. |
N. I. Stas’kov, A. B. Sotski, L. I. Sotskaya, I. V. Ivashkevich, A. I. Kulak, N. V. Gaponenko, M. V. Rudenko, A. N. Pyatlitski, “Optical characteristics of strontium titanate films obtained by the sol–gel method”, Optics and Spectroscopy, 125:4 (2018), 473–478 ; Optics and Spectroscopy, 125:4 (2018), 492–498 |
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2017 |
| 7. |
A. B. Sotsky, A. V. Shilov, L. I. Sotskaya, “Propagation of terahertz pulses in capillary waveguides with a metalized cladding”, Computer Optics, 41:6 (2017), 803–811 |
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2014 |
| 8. |
A. B. Sotsky, O. A. Belskaya, L. I. Sotskaya, “Diffraction of light beam on microstructured fiber”, Computer Optics, 38:1 (2014), 11–19 |
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2012 |
| 9. |
N. I. Stas’kov, I. V. Ivashkevich, A. B. Sotski, L. I. Sotskaya, “The account of influence of the natural surface layer under investigation of silicon plates by the method
of spectral ellipsometry”, PFMT, 2012, no. 1(10), 26–30 |
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