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Publications in Math-Net.Ru |
Citations |
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2018 |
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N. I. Stas’kov, A. B. Sotski, L. I. Sotskaya, I. V. Ivashkevich, A. I. Kulak, N. V. Gaponenko, M. V. Rudenko, A. N. Pyatlitski, “Optical characteristics of strontium titanate films obtained by the sol–gel method”, Optics and Spectroscopy, 125:4 (2018), 473–478   ; Optics and Spectroscopy, 125:4 (2018), 492–498 |
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2013 |
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N. I. Stas’kov, I. V. Ivashkevich, N. A. Krekoten, “Ellipsometry of the transitive layers semiconductor–dielectric”, PFMT, 2013, no. 2(15), 18–24 |
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2012 |
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N. I. Stas’kov, I. V. Ivashkevich, A. B. Sotski, L. I. Sotskaya, “The account of influence of the natural surface layer under investigation of silicon plates by the method
of spectral ellipsometry”, PFMT, 2012, no. 1(10), 26–30 |
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