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Publications in Math-Net.Ru |
Citations |
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2019 |
| 1. |
E. V. Demidov, V. M. Grabov, V. A. Komarov, A. N. Krushelnitckii, A. V. Suslov, M. V. Suslov, “Specific features of the quantum-size effect in transport phenomena in bismuth-thin films on mica substrates”, Fizika i Tekhnika Poluprovodnikov, 53:6 (2019), 736–740   ; Semiconductors, 53:6 (2019), 727–731 |
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2018 |
| 2. |
E. V. Demidov, V. M. Grabov, V. A. Komarov, N. S. Kablukova, A. N. Krushelnitckii, “Topological insulator state in thin bismuth films subjected to plane tensile strain”, Fizika Tverdogo Tela, 60:3 (2018), 452–455 ; Phys. Solid State, 60:3 (2018), 457–460 |
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2017 |
| 3. |
V. M. Grabov, E. V. Demidov, E. K. Ivanova, V. A. Komarov, N. S. Kablukova, A. N. Krushelnitckii, M. V. Staritsyn, “Influence of annealing at temperatures above the solidus temperature on the structure and galvanomagnetic properties of Bi$_{92}$Sb$_{8}$ solid-solution thin films”, Zhurnal Tekhnicheskoi Fiziki, 87:7 (2017), 1071–1077 ; Tech. Phys., 62:7 (2017), 1087–1092 |
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A. N. Krushelnitckii, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, V. A. Komarov, “Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness”, Fizika i Tekhnika Poluprovodnikov, 51:7 (2017), 914–916 ; Semiconductors, 51:7 (2017), 876–878 |
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E. V. Demidov, V. A. Komarov, A. N. Krushelnitckii, A. V. Suslov, “Measurement of the thickness of block-structured bismuth films by atomic-force microscopy combined with selective chemical etching”, Fizika i Tekhnika Poluprovodnikov, 51:7 (2017), 877–879 ; Semiconductors, 51:7 (2017), 840–842 |
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V. M. Grabov, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, A. N. Krushelnitckii, S. V. Senkevich, “Structure of bismuth films obtained using an array of identically oriented single-crystal bismuth islands preliminarily grown on a substrate”, Fizika i Tekhnika Poluprovodnikov, 51:7 (2017), 867–869 ; Semiconductors, 51:7 (2017), 831–833 |
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