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Fizika i Tekhnika Poluprovodnikov, 2017, Volume 51, Issue 7, Pages 877–879
DOI: https://doi.org/10.21883/FTP.2017.07.44631.17 (Mi phts6088) 		 
This article is cited in 12 scientific papers (total in 12 papers)

XV International Conference ''Thermoelectrics and Their Applications-2016 St. Petersburg'', November 15-16, 2016

Measurement of the thickness of block-structured bismuth films by atomic-force microscopy combined with selective chemical etching

E. V. Demidov, V. A. Komarov, A. N. Krushelnitckii, A. V. Suslov

Herzen State Pedagogical University of Russia, St. Petersburg
Full-text PDF (197 kB) Citations (12)
DOI: https://doi.org/10.21883/FTP.2017.07.44631.17
Abstract: A method for measuring the thickness of block-structured films by atomic-force microscopy and selective chemical etching is proposed. The method is tested for thin bismuth films formed on mica by thermal evaporation in vacuum.
Received: 27.12.2016
Accepted: 12.01.2017
English version:
Semiconductors, 2017, Volume 51, Issue 7, Pages 840–842
DOI: https://doi.org/10.1134/S1063782617070065
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: E. V. Demidov, V. A. Komarov, A. N. Krushelnitckii, A. V. Suslov, “Measurement of the thickness of block-structured bismuth films by atomic-force microscopy combined with selective chemical etching”, Fizika i Tekhnika Poluprovodnikov, 51:7 (2017), 877–879; Semiconductors, 51:7 (2017), 840–842
Citation in format AMSBIB
\Bibitem{DemKomKru17}
\by E.~V.~Demidov, V.~A.~Komarov, A.~N.~Krushelnitckii, A.~V.~Suslov
\paper Measurement of the thickness of block-structured bismuth films by atomic-force microscopy combined with selective chemical etching
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2017
\vol 51
\issue 7
\pages 877--879
\mathnet{http://mi.mathnet.ru/phts6088}
\crossref{https://doi.org/10.21883/FTP.2017.07.44631.17}
\elib{https://elibrary.ru/item.asp?id=29772346 }
\transl
\jour Semiconductors
\yr 2017
\vol 51
\issue 7
\pages 840--842
\crossref{https://doi.org/10.1134/S1063782617070065}
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  • https://www.mathnet.ru/eng/phts/v51/i7/p877
    • This publication is cited in the following 12 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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