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This article is cited in 3 scientific papers (total in 3 papers)
XV International Conference ''Thermoelectrics and Their Applications-2016 St. Petersburg'', November 15-16, 2016
Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness
A. N. Krushelnitckii, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, V. A. Komarov Herzen State Pedagogical University of Russia, St. Petersburg
Abstract:
The results of studying the surface of 15- to 100-nm-thick bismuth films by atomic-force microscopy are reported. The near-linear character of the dependences of the average surface roughness and the average height of growth patterns on the film thickness is established. It is found that the average crystallite size increases, as the film thickness is increased. A slight dependence of the crystallite size on the film thickness is observed at thicknesses in the range of 27–70 nm.
Received: 27.12.2016 Accepted: 12.01.2017
Citation:
A. N. Krushelnitckii, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, V. A. Komarov, “Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness”, Fizika i Tekhnika Poluprovodnikov, 51:7 (2017), 914–916; Semiconductors, 51:7 (2017), 876–878
Linking options:
https://www.mathnet.ru/eng/phts6098 https://www.mathnet.ru/eng/phts/v51/i7/p914
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Abstract page: | 36 | Full-text PDF : | 7 |
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