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Fizika i Tekhnika Poluprovodnikov, 2017, Volume 51, Issue 7, Pages 914–916
DOI: https://doi.org/10.21883/FTP.2017.07.44641.27 (Mi phts6098) 		 
This article is cited in 3 scientific papers (total in 3 papers)

XV International Conference ''Thermoelectrics and Their Applications-2016 St. Petersburg'', November 15-16, 2016

Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness

A. N. Krushelnitckii, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, V. A. Komarov

Herzen State Pedagogical University of Russia, St. Petersburg
Full-text PDF (220 kB) Citations (3)
DOI: https://doi.org/10.21883/FTP.2017.07.44641.27
Abstract: The results of studying the surface of 15- to 100-nm-thick bismuth films by atomic-force microscopy are reported. The near-linear character of the dependences of the average surface roughness and the average height of growth patterns on the film thickness is established. It is found that the average crystallite size increases, as the film thickness is increased. A slight dependence of the crystallite size on the film thickness is observed at thicknesses in the range of 27–70 nm.
Received: 27.12.2016
Accepted: 12.01.2017
English version:
Semiconductors, 2017, Volume 51, Issue 7, Pages 876–878
DOI: https://doi.org/10.1134/S1063782617070211
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. N. Krushelnitckii, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, V. A. Komarov, “Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness”, Fizika i Tekhnika Poluprovodnikov, 51:7 (2017), 914–916; Semiconductors, 51:7 (2017), 876–878
Citation in format AMSBIB
\Bibitem{KruDemIva17}
\by A.~N.~Krushelnitckii, E.~V.~Demidov, E.~K.~Ivanova, N.~S.~Kablukova, V.~A.~Komarov
\paper Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2017
\vol 51
\issue 7
\pages 914--916
\mathnet{http://mi.mathnet.ru/phts6098}
\crossref{https://doi.org/10.21883/FTP.2017.07.44641.27}
\elib{https://elibrary.ru/item.asp?id=29772356}
\transl
\jour Semiconductors
\yr 2017
\vol 51
\issue 7
\pages 876--878
\crossref{https://doi.org/10.1134/S1063782617070211}
Linking options:
  • https://www.mathnet.ru/eng/phts6098
  • https://www.mathnet.ru/eng/phts/v51/i7/p914
    • This publication is cited in the following 3 articles:
    1. V.A. Gerega, A.V. Suslov, V.M. Grabov, V.A. Komarov, A.V. Kolobov, “Effect of surface states and in-plane deformation on transport properties of charge carriers in bismuth films”, Applied Surface Science, 665 (2024), 160275  crossref
    2. Anton Suslov, Vasilisa Gerega, Arkadi Rodionov, Mikhail Fedoseev, Vladimir Komarov, Vladimir Grabov, “Changes in the Crystal Lattice Parameters of Bismuth Films on Substrates with Different Thermal Expansion”, Cryst. Res. Technol., 59:7 (2024)  crossref
    3. Gerega Vasilisa, Suslov Anton, Stepanov Roman, Komarov Vladimir, Grabov Vladimir, Kuznetsov Vladimir, Kolobov Alexander, “Effect of uniaxial deformation along the trigonal axis on the band structure of bulk bismuth”, Eur. Phys. J. Plus, 138:8 (2023)  crossref
    Citing articles in Google Scholar: Russian citations, English citations
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