Fizika i Tekhnika Poluprovodnikov
RUS  ENG    JOURNALS   PEOPLE   ORGANISATIONS   CONFERENCES   SEMINARS   VIDEO LIBRARY   PACKAGE AMSBIB  
General information
Latest issue
Archive

Search papers
Search references

RSS
Latest issue
Current issues
Archive issues
What is RSS



Fizika i Tekhnika Poluprovodnikov:
Year:
Volume:
Issue:
Page:
Find






Personal entry:
Login:
Password:
Save password
Enter
Forgotten password?
Register


Fizika i Tekhnika Poluprovodnikov, 2017, Volume 51, Issue 7, Pages 914–916
DOI: https://doi.org/10.21883/FTP.2017.07.44641.27
(Mi phts6098)
 

This article is cited in 3 scientific papers (total in 3 papers)

XV International Conference ''Thermoelectrics and Their Applications-2016 St. Petersburg'', November 15-16, 2016

Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness

A. N. Krushelnitckii, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, V. A. Komarov

Herzen State Pedagogical University of Russia, St. Petersburg
Full-text PDF (220 kB) Citations (3)
Abstract: The results of studying the surface of 15- to 100-nm-thick bismuth films by atomic-force microscopy are reported. The near-linear character of the dependences of the average surface roughness and the average height of growth patterns on the film thickness is established. It is found that the average crystallite size increases, as the film thickness is increased. A slight dependence of the crystallite size on the film thickness is observed at thicknesses in the range of 27–70 nm.
Received: 27.12.2016
Accepted: 12.01.2017
English version:
Semiconductors, 2017, Volume 51, Issue 7, Pages 876–878
DOI: https://doi.org/10.1134/S1063782617070211
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. N. Krushelnitckii, E. V. Demidov, E. K. Ivanova, N. S. Kablukova, V. A. Komarov, “Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness”, Fizika i Tekhnika Poluprovodnikov, 51:7 (2017), 914–916; Semiconductors, 51:7 (2017), 876–878
Citation in format AMSBIB
\Bibitem{KruDemIva17}
\by A.~N.~Krushelnitckii, E.~V.~Demidov, E.~K.~Ivanova, N.~S.~Kablukova, V.~A.~Komarov
\paper Dependence of the surface morphology of ultrathin bismuth films on mica substrates on the film thickness
\jour Fizika i Tekhnika Poluprovodnikov
\yr 2017
\vol 51
\issue 7
\pages 914--916
\mathnet{http://mi.mathnet.ru/phts6098}
\crossref{https://doi.org/10.21883/FTP.2017.07.44641.27}
\elib{https://elibrary.ru/item.asp?id=29772356}
\transl
\jour Semiconductors
\yr 2017
\vol 51
\issue 7
\pages 876--878
\crossref{https://doi.org/10.1134/S1063782617070211}
Linking options:
  • https://www.mathnet.ru/eng/phts6098
  • https://www.mathnet.ru/eng/phts/v51/i7/p914
  • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
    Fizika i Tekhnika Poluprovodnikov Fizika i Tekhnika Poluprovodnikov
    Statistics & downloads:
    Abstract page:36
    Full-text PDF :7
     
      Contact us:
     Terms of Use  Registration to the website  Logotypes © Steklov Mathematical Institute RAS, 2024