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Publications in Math-Net.Ru |
Citations |
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2019 |
| 1. |
V. K. Egorov, E. V. Egorov, M. S. Afanasiev, “Ion-beam and X-ray methods of elemental diagnostics of thin film coatings”, Fizika Tverdogo Tela, 61:12 (2019), 2454–2460   ; Phys. Solid State, 61:12 (2019), 2480–2486 |
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2018 |
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V. K. Egorov, E. V. Egorov, “Peculiarities in the formation of X-ray fluxes by waveguide–resonators of different construction”, Optics and Spectroscopy, 124:6 (2018), 808–820 ; Optics and Spectroscopy, 124:6 (2018), 838–849 |
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2017 |
| 3. |
V. K. Egorov, E. V. Egorov, S. A. Kukushkin, A. V. Osipov, “Structural heteroepitaxy during topochemical transformation of silicon to silicon carbide”, Fizika Tverdogo Tela, 59:4 (2017), 755–761 ; Phys. Solid State, 59:4 (2017), 773–779 |
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