1. |
V. F. Zinchenko, K. V. Lavrent’ev, V. V. Emel'yanov, A. S. Vatuev, “Comparative analysis of breakdown mechanism in thin SiO$_2$ oxide films in metal–oxide–semiconductor structures under the action of heavy charged particles and a pulsed voltage”, Zhurnal Tekhnicheskoi Fiziki, 86:2 (2016), 30–36 ; Tech. Phys., 61:2 (2016), 187–193 |
1
|