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Публикации в базе данных Math-Net.Ru |
Цитирования |
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2017 |
1. |
Abhishek Vikram, Vineeta Agarwal, “Patterning approach for detecting defect in device manufacturing”, Физика и техника полупроводников, 51:12 (2017), 1716–1720 ; Semiconductors, 51:12 (2017), 1661–1665 |
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