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Публикации в базе данных Math-Net.Ru |
Цитирования |
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2020 |
1. |
S.-L. Tyan, H.-C. Tang, Z.-W. Wu, T.-S. Mo, “Reliability characteristics of diamond-like carbon as gate insulator for metal–insulator–semiconductor application”, Физика твердого тела, 62:10 (2020), 1646 ; Phys. Solid State, 62:10 (2020), 1845–1849 |
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