|
|
|
Publications in Math-Net.Ru |
Citations |
|
1996 |
| 1. |
S. L. Musher, M. F. Stupak, V. S. Syskin, “The use of phase matching as the null method for scanning bulk deformation fields in semiconductor materials”, Kvantovaya Elektronika, 23:8 (1996), 762–764  [Quantum Electron., 26:8 (1996), 743–745  ] |
3
|
|
1995 |
| 2. |
V. V. Balanyuk, V. F. Krasnov, S. L. Musher, V. I. Prots', V. E. Ryabchenko, S. A. Stoyanov, S. G. Struts, M. F. Stupak, V. S. Syskin, “Determination of local crystal quality characteristics and of the orientation of CdTe semiconductor films by nonlinear optical methods”, Kvantovaya Elektronika, 22:2 (1995), 196–200 [Quantum Electron., 25:2 (1995), 183–186 ] |
5
|
|
| Organisations |
|
|
Contact us: