S. L. Musher, M. F. Stupak, V. S. Syskin, “The use of phase matching as the null method for scanning bulk deformation fields in semiconductor materials”, Kvantovaya Elektronika, 23:8 (1996), 762–764 [Quantum Electron., 26:8 (1996), 743

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Kvantovaya Elektronika, 1996, Volume 23, Number 8, Pages 762–764 (Mi qe768)

This article is cited in 3 scientific papers (total in 3 papers)

Laser applications and other topics in quantum electronics

The use of phase matching as the null method for scanning bulk deformation fields in semiconductor materials

S. L. Musher, M. F. Stupak, V. S. Syskin

Institute of Automation and Electrometry, Siberian Branch of Russian Academy of Sciences, Novosibirsk

Full-text PDF (198 kB) Citations (3)

Abstract: A high polarisation sensitivity of the phase matching in nonlinear crystals was utilised in fast scanning of bulk deformation fields in semiconductor substrates and films.

Received: 01.01.1996

English version:
Quantum Electronics, 1996, Volume 26, Issue 8, Pages 743–745
DOI: https://doi.org/10.1070/QE1996v026n08ABEH000768

Bibliographic databases:

Document Type: Article

PACS: 62.20.Fe, 42.62.Eh

Language: Russian

Citation: S. L. Musher, M. F. Stupak, V. S. Syskin, “The use of phase matching as the null method for scanning bulk deformation fields in semiconductor materials”, Kvantovaya Elektronika, 23:8 (1996), 762–764 [Quantum Electron., 26:8 (1996), 743–745]

Linking options:

https://www.mathnet.ru/eng/qe768

https://www.mathnet.ru/eng/qe/v23/i8/p762

This publication is cited in the following 3 articles:

Citing articles in Google Scholar: Russian citations, English citations
Related articles in Google Scholar: Russian articles, English articles

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