Yarmolik V.N., Demidenko S.N., Generation and Application of Pseudorandom Sequences for Random Testing., John Wiley & Sons Inc.,, New York, NY, USA, 1988
Yarmolik V.N., Fault Diagnosis of Digital Circuits, John Wiley & Sons, Chichester, England and New York, 1990
Ярмолик В.Н., Контроль и диагностика вычислительных систем, Бестпринт, Минск, 2019
V. N. Yarmolik, N. A. Shevchenko, “Synthesis of test sequences with a given switching activity”, Avtomat. i Telemekh., 2022, no. 2, 154–168; Autom. Remote Control, 83:2 (2022), 291–302
2007
2.
V. N. Yarmolik, S. V. Yarmolik, “The repeated nondestructive march tests with variable address sequences”, Avtomat. i Telemekh., 2007, no. 4, 126–137; Autom. Remote Control, 68:4 (2007), 688–698
I. A. Murashko, V. N. Yarmolik, “Pseudorandom test pattern generators for built-in self-testing: a power reduction method”, Avtomat. i Telemekh., 2004, no. 8, 102–114; Autom. Remote Control, 65:8 (2004), 1265–1275
A. P. Zankovich, V. N. Yarmolik, “Nondestructive RAM Testing by Analyzing the Output Data for Symmetry”, Avtomat. i Telemekh., 2003, no. 9, 141–154; Autom. Remote Control, 64:9 (2003), 1488–1500
Yu. V. Bykov, A. A. Ivanyuk, A. I. Yanushkevich, V. N. Yarmolik, “Iddq testing-based diagnosis of faults in CMOS-circuits”, Avtomat. i Telemekh., 1999, no. 7, 142–153; Autom. Remote Control, 60:7 (1999), 1021–1020
6.
L. A. Zakrevskiy, A. A. Ivanyuk, A. I. Yanushkevich, V. N. Yarmolik, “Nondestructive testing of memory elements by built-in parity-check facilities”, Avtomat. i Telemekh., 1999, no. 2, 120–128; Autom. Remote Control, 60:2 (1999), 243–249
A. A. Ivanyuk, A. I. Yanushkevich, V. N. Yarmolik, “IDDQ testing technology for one-dimensional iterative logic arrays”, Avtomat. i Telemekh., 1999, no. 1, 148–158; Autom. Remote Control, 60:1 (1999), 118–126
1998
8.
I. A. Murashko, A. M. Shmidman, V. N. Yarmolik, “Built-in self-test scanners for very large-scale integration: a new design approach”, Avtomat. i Telemekh., 1998, no. 7, 157–167; Autom. Remote Control, 59:7 (1998), 1032–1039
1996
9.
Yu. V. Bykov, V. N. Yarmolik, “Converter Synthesis of Pseudorandom Codes for Self-Testing of Digital Devices Satisfying the IEEE Standards”, Avtomat. i Telemekh., 1996, no. 4, 148–154; Autom. Remote Control, 57:4 (1996), 581–586
1994
10.
Yu. V. Bykov, V. N. Yarmolik, “Synthesis of transformers of pseudorandom codes for testing digital schemes”, Avtomat. i Telemekh., 1994, no. 10, 151–157; Autom. Remote Control, 55:10 (1994), 1518–1523
11.
Yu. V. Bykov, L. A. Zakrevskiĭ, V. N. Yarmolik, “Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits”, Avtomat. i Telemekh., 1994, no. 4, 144–150; Autom. Remote Control, 55:4 (1994), 576–581
12.
L. A. Zakrevskii, E. P. Kalosha, I. V. Kachan, N. N. Chatkevich, V. N. Yarmolik, “Boundary scan and its application to the testing of digital devices”, Avtomat. i Telemekh., 1994, no. 1, 3–31; Autom. Remote Control, 1:1 (1994), 1–20
1992
13.
V. N. Yarmolik, “Calculation of signatures of regular periodic sequences”, Avtomat. i Telemekh., 1992, no. 1, 146–155; Autom. Remote Control, 53:1 (1992), 119–126
1991
14.
E. P. Kalosha, I. V. Kachan, V. N. Yarmolik, “Analysis of General Purpose Unit in Organizing of VLSI Self-diagnostics”, Avtomat. i Telemekh., 1991, no. 1, 105–112
1990
15.
Yu. L. Sagalovich, V. N. Yarmolik, “Synthesis of a signature analyzer for two-level combinational circuits”, Avtomat. i Telemekh., 1990, no. 4, 155–160; Autom. Remote Control, 51:4 (1990), 549–553
1989
16.
V. N. Yarmolik, “Analysis of signature testing of digital circuits”, Avtomat. i Telemekh., 1989, no. 10, 159–167; Autom. Remote Control, 5:10 (1989), 1437–1443
17.
E. P. Kalosha, Y. I. Katsnel'son, V. N. Yarmolik, “On credibility of compact testing methods”, Avtomat. i Telemekh., 1989, no. 9, 160–166; Autom. Remote Control, 50:9 (1989), 1281–1286
1988
18.
V. N. Yarmolik, “Design of pseudo-random test sequence generators”, Avtomat. i Telemekh., 1988, no. 9, 119–125; Autom. Remote Control, 49:9 (1988), 1204–1209
1985
19.
V. N. Yarmolik, “Design of Multi-Channel Signature Analyzers”, Avtomat. i Telemekh., 1985, no. 1, 127–132
1983
20.
V. N. Yarmolik, “Designing generators of pseudorandom sequences of test signals”, Avtomat. i Telemekh., 1983, no. 6, 155–162; Autom. Remote Control, 44:6 (1983), 816–822
2012
21.
S. V. Yarmolik, V. N. Yarmolik, “Controlled random tests”, Avtomat. i Telemekh., 2012, no. 10, 142–155; Autom. Remote Control, 73:10 (2012), 1704–1714
Contact us: