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Publications in Math-Net.Ru |
Citations |
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2020 |
1. |
H. Wang, G. Jin, Q. Tan, “Microstructural characterization of V-defects in InGaN/GaN multiquantum wells”, Pis'ma v Zh. Èksper. Teoret. Fiz., 111:5 (2020), 301–302 ; JETP Letters, 111:5 (2020), 264–267 |
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Organisations |
- Academy of Electronic Information and Electrical Engineering, Xiangnan University Chenzhou, 423000, China
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