|
|
|
Publications in Math-Net.Ru |
Citations |
|
2021 |
| 1. |
A. A. Lomov, B. M. Seredin, S. Yu. Martyushov, A. N. Zaichenko, I. L. Shul'pina, “The formation and structure of thermomigration silicon channels doped with Ga”, Zhurnal Tekhnicheskoi Fiziki, 91:3 (2021), 467–474   ; Tech. Phys., 66:3 (2021), 453–460  |
6
|
|
2020 |
| 2. |
A. A. Lomov, B. M. Seredin, S. Yu. Martyushov, A. N. Zaichenko, S. G. Simakin, I. L. Shul'pina, “Structural perfection and composition of gallium-doped thermomigration silicon layers”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 46:6 (2020), 27–30 ; Tech. Phys. Lett., 46:3 (2020), 279–282 |
3
|
|
2019 |
| 3. |
I. L. Shul'pina, I. A. Prokhorov, “Results of the experiments on the crystallization of a Ge–Si–Sb solid solution under the conditions of microgravity on the Soyuz–Apollo spacecraft”, Fizika Tverdogo Tela, 61:4 (2019), 664–670 ; Phys. Solid State, 61:4 (2019), 541–547 |
|
1992 |
| 4. |
A. L. Trainin, I. L. Shul'pina, “Study of the nature of the dislocation loop sources by X-ray diffraction topography”, Fizika Tverdogo Tela, 34:3 (1992), 708–713 |
|
1991 |
| 5. |
A. I. Belyaeva, V. P. Yur'ev, A. L. Foshchan, E. I. Golovenchits, N. V. Morozov, I. L. Shul'pina, M. P. Shcheglov, “Correlation of inhomogeneities in the superconducting properties with the variation of the lattice parameter $C$ in nontwinning $\mathrm{YBa}_{2}\mathrm{Cu}_{3-z}\mathrm{Al}_{y}\mathrm{O}_{6+x}$ crystals”, Fizika Tverdogo Tela, 33:10 (1991), 2896–2906 |
|
1990 |
| 6. |
A. S. Tregubova, E. N. Mokhov, I. L. Shul'pina, “Motion of surface damage-induced dislocations in $\mathrm{SiC}$”, Fizika Tverdogo Tela, 32:8 (1990), 2311–2315 |
|
1987 |
| 7. |
P. V. Petrashen, F. N. Chukhovskii, I. L. Shul'pina, R. N. Kyutt, “A new type of interference bands in Bragg section topograms”, Fizika Tverdogo Tela, 29:5 (1987), 1608–1611 |
| 8. |
T. S. Argunova, A. A. Kusov, P. V. Petrashen, I. L. Shul'pina, “ANOMALOUS OBSERVABILITY OF THE X-RAY TOPOGRAPHIC CONTRAST OF DISLOCATION
LATTICES OF NONCOMFORMITY IN HETEROEPITAXIAL STRUCTURES”, Zhurnal Tekhnicheskoi Fiziki, 57:6 (1987), 1114–1120 |
| 9. |
T. S. Argunova, A. N. Baranov, B. E. Djurtanov, G. N. Mosina, I. L. Shul'pina, Yu. P. Yakovlev, “DEFECT FORMATION IN GAALSB/GASB STRUCTURES FOR PHOTODIODES”, Zhurnal Tekhnicheskoi Fiziki, 57:2 (1987), 316–321 |
| 10. |
V. A. Gevorkyan, K. M. Gambaryan, T. S. Argunova, I. L. Shul'pina, “Dislocation-structure and volt-ampere characteristics of diode smooth $n-In\,As/p-In\,As_{1-x}\,P_{x}$ heterosystems, obtained by the electric liquid epitaxy method”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:18 (1987), 1134–1139 |
| 11. |
E. N. Mokhov, M. G. Ramm, A. D. Roenkov, A. A. Vol'fson, A. S. Tregubova, I. L. Shul'pina, “Origination of structural ruptures in epitaxial layers of silicon-carbide”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:11 (1987), 641–645 |
|
1986 |
| 12. |
N. B. Guseva, È. G. Sheikhet, V. V. Shpeyzman, I. L. Shul'pina, “Dislocation activity of microdefects in silicon single crystals”, Fizika Tverdogo Tela, 28:10 (1986), 3192–3194 |
| 13. |
V. M. Kaganer, N. O. Krylova, V. L. Indenbom, I. L. Shul'pina, “Wave packets and microdefect images in double crystal X-ray topography”, Fizika Tverdogo Tela, 28:8 (1986), 2343–2351 |
| 14. |
T. S. Argunova, S. S. Ruvimov, I. L. Shul'pina, “X-ray topography determination of misfit dislocation sign”, Fizika Tverdogo Tela, 28:4 (1986), 1052–1057 |
| 15. |
N. O. Krylova, V. Meling, I. L. Shul'pina, È. G. Sheikhet, “X-ray topography study of microdefects in silicon”, Fizika Tverdogo Tela, 28:2 (1986), 440–446 |
|
1985 |
| 16. |
T. S. Argunova, S. S. Ruvimov, L. M. Sorokin, I. L. Shul'pina, “Misfit $60^{\circ}$-degree-dislocations in $\mathrm{In}_{x}\mathrm{Ga}_{1-x}\mathrm{As}/\mathrm{GaAs} (001)$ type heterostructures”, Fizika Tverdogo Tela, 27:10 (1985), 2960–2964 |
| 17. |
L. V. Golubev, V. N. Karyaev, S. V. Kidalov, T. S. Argunova, I. L. Shul'pina, “DISLOCATION DENSITY AND P-N STRUCTURE PARAMETERS BASED ON GAAS(1-X)SBX
SOLID-SOLUTIONS”, Zhurnal Tekhnicheskoi Fiziki, 55:11 (1985), 2280–2282 |
|
1983 |
| 18. |
N. O. Krylova, E. K. Kovev, I. L. Shul'pina, “METHODS OF THE STUDY OF MICRODEFECTS IN SILICON MONOCRYSTALS ON AN X-RAY
TOPOGRAPHIC DTS-1 SPECTROMETER”, Zhurnal Tekhnicheskoi Fiziki, 53:9 (1983), 1750–1753 |
|
1978 |
| 19. |
P. V. Petrashen, F. N. Chukhovskii, I. L. Shul'pina, “Solution of the problem of X-ray projection topogram calculation”, Dokl. Akad. Nauk SSSR, 240:4 (1978), 836–838 |
|
| Organisations |
|
| |
|
|
Contact us: