3. Suvorov E.V., Metody issledovaniya realnoi struktury i sostava materialov.
Moskva, Izdatelskii dom MISiS, 2011, -163c. (ISBN978-5-87623-512-1, Uch.-izd.l.20,4, reg.#248)
4. E.V.Suvorov, I.A.Smirnova Novyi podkhod v ponimanii mekhanizmov difraktsionnogo izobrazheniya dislokatsii v rentgenovskoi topografii
Pisma ZhTF 2012, 38,21, c.70-76
I. A. Smirnova, E. V. Shulakov, E. V. Suvorov, “Formation of edge dislocation image under anomalous X-ray transmission”, Fizika Tverdogo Tela, 61:8 (2019), 1499–1504; Phys. Solid State, 61:8 (2019), 1444–1449
E. V. Suvorov, I. A. Smirnova, “A new high-sensitivity X-ray diffraction technique for determining local deformations of a crystal surface using “bending interference fringes””, Pisma v Zhurnal Tekhnicheskoi Fiziki, 42:18 (2016), 55–62; Tech. Phys. Lett., 42:9 (2016), 955–958
E. V. Suvorov, I. A. Smirnova, “X-ray diffraction imaging of defects in topography (microscopy) studies”, UFN, 185:9 (2015), 897–915; Phys. Usp., 58:9 (2015), 833–849
I. V. Grekhov, A. F. Kardo-Sisoev, I. A. Smirnova, S. V. Shenderei, V. S. Yuferev, “Fast Ionization Waves in a Semiconductor Related with Superradiation”, Fizika i Tekhnika Poluprovodnikov, 20:7 (1986), 1335–1337
1985
5.
I. V. Grekhov, V. M. Efanov, A. F. Kardo-Sisoev, I. A. Smirnova, “Semiconductor powerful subnanosecond commutators with more time retentivity under conducting conditions”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 11:15 (1985), 901–904