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This article is cited in 13 scientific papers (total in 13 papers)
REVIEWS OF TOPICAL PROBLEMS
X-ray diffraction imaging of defects in topography (microscopy) studies
E. V. Suvorov, I. A. Smirnova Institute of Solid State Physics, Russian Academy of Sciences
Abstract:
This review discusses how the X-ray diffraction images of crystal lattice defects form and acquire structure when using X-ray topography methods. Approaches for describing (ray optics and wave optics) and application fields of the geometrical and diffraction optics of a real crystal are analyzed. Specific experimental images of dislocations and other defects are used as examples to demonstrate the role of various diffraction effects (wave reflection from lattice distortions, diffraction focusing, channeling) in determining the character of the image formed. The potential for obtaining quantitative information on defect parameters is discussed.
Received: May 5, 2015 Accepted: June 9, 2015
Citation:
E. V. Suvorov, I. A. Smirnova, “X-ray diffraction imaging of defects in topography (microscopy) studies”, UFN, 185:9 (2015), 897–915; Phys. Usp., 58:9 (2015), 833–849
Linking options:
https://www.mathnet.ru/eng/ufn5298 https://www.mathnet.ru/eng/ufn/v185/i9/p897
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