Two-parameter method of determinining stress intensity factor $K_{I}$ of crack-like defects using holographic interferometry

A new method has been developed for finding the stress intensity coefficient and the nominal stress $\sigma_{ox}$ for a plate with a crack-like (elliptical) defect. As an experimental basis, the patterns of bands of absolute path difference obtained on the basis of the method of holographic interferometry are taken. Using Favre ratios and approximate decomposition of stress components for the plane case, the stress intensity coefficient and the nominal stress $\sigma_{ox}$ are determined. The difference of the proposed method is in a more accurate representation of the stress tensor in the vicinity of the vertex of a crack-like defect. Such representation allows one to take the geometry of the defect into account. The values of the correction function calculated by the proposed method in the formula for theoretical determining of the intensity factor have been higher than those obtained by previously used methods. This indicates a possible underestimation of the magnitude of the intensity factor when using the previously proposed methods. In addition to using more precise formulas for the stress tensor, the approach implies considering the nominal stress and the intensity factor as independent parameters. Full consideration of the crack geometry and loading features is very difficult from a mathematical point of view; however, this property of the method allows partially compensating for the simplifications of the stress tensor analytic expressions. Also, this method makes it possible to determine the main stresses and the intensity of stresses in the vicinity of the vertex of the defect. The obtained formulas agree well with experimental results.