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This article is cited in 1 scientific paper (total in 1 paper)
CONFERENCES AND SYMPOSIA
Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams
A. A. Bukharaev Zavoisky Physical Technical Institute, Kazan Scientific Center of the Russian Academy of Sciences
Citation:
A. A. Bukharaev, “Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams”, UFN, 166:2 (1996), 210–213; Phys. Usp., 39:2 (1996), 193–196
Linking options:
https://www.mathnet.ru/eng/ufn1160 https://www.mathnet.ru/eng/ufn/v166/i2/p210
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