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Uspekhi Fizicheskikh Nauk, 1996, Volume 166, Number 2, Pages 210–213
DOI: https://doi.org/10.3367/UFNr.0166.199602i.0210
(Mi ufn1160)
 

This article is cited in 1 scientific paper (total in 1 paper)

CONFERENCES AND SYMPOSIA

Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams

A. A. Bukharaev

Zavoisky Physical Technical Institute, Kazan Scientific Center of the Russian Academy of Sciences
English version:
Physics–Uspekhi, 1996, Volume 39, Issue 2, Pages 193–196
DOI: https://doi.org/10.1070/PU1996v039n02ABEH001499
Bibliographic databases:
Document Type: Article
PACS: 07.79.Cz, 07.79.Lh, 42.62.Hk
Language: Russian


Citation: A. A. Bukharaev, “Scanning tunnelling and atomic force microscopy of surfaces modified by ion and laser beams”, UFN, 166:2 (1996), 210–213; Phys. Usp., 39:2 (1996), 193–196
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  • https://www.mathnet.ru/eng/ufn/v166/i2/p210
    CONFERENCES AND SYMPOSIA
    This publication is cited in the following 1 articles:
    Citing articles in Google Scholar: Russian citations, English citations
    Related articles in Google Scholar: Russian articles, English articles
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