Modern approaches to the investigation of thin films and monolayers: X-ray reflectometry, grazing incidence scattering and X-ray standing wave method

Modern experimental approaches to the investigation of thin films and monolayers based on the effect of total internal reflection of X-ray radiation from the substrate (X-ray reflectometry, grazing incidence scattering and X-ray standing wave method) are described. Their potential is demonstrated by considering a number of studies of organic macromolecular systems possessing semiconducting properties, which are promising as thin-film transistors, light emitting diodes and photovoltaic cells. It is shown that using a combination of the above-mentioned methods, it is possible to investigate the structure of thin film materials and structure formation processes in them with high accuracy and thus to obtain information needed to improve the efficiency of organic electronic elements.
Bibliography — 92 references.