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Russian Chemical Reviews, 1983, Volume 52, Issue 6, Pages 524–531
DOI: https://doi.org/10.1070/RC1983v052n06ABEH002860
(Mi rcr3472)
 

This article is cited in 2 scientific papers (total in 2 papers)

Kinetics and Mechanism of the Dissolution and Oxidation of Semiconductors

S. M. Repinsky

Institute of Semiconductor Physics of USSR Academy of Sciences, Siberian Branch, Novosibirsk
English full-text Citations (2)
Abstract: A generalised kinetic approach to the description of the dissolution of semiconductors (including the thermal oxidation of silicon and germanium) is based on a statistical thermodynamic analysis of the adsorption steps, and on an analysis of the structure of the activated complex and of the effects of solvation of the intermediate and the final products (calculated from model descriptions). 66 references.
Russian version:
Uspekhi Khimii, 1983, Volume 52, Issue 6, Pages 922–935
DOI: https://doi.org/10.1070/RC1983v052n06ABEH002860
Bibliographic databases:
Document Type: Article
UDC: 537.311.33+541.183
Language: English
Original paper language: Russian


Citation: S. M. Repinsky, “Kinetics and Mechanism of the Dissolution and Oxidation of Semiconductors”, Usp. Khim., 52:6 (1983), 922–935; Russian Chem. Reviews, 52:6 (1983), 524–531
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  • https://www.mathnet.ru/eng/rcr/v52/i6/p922
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