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This article is cited in 43 scientific papers (total in 43 papers)
Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces
A. I. Danilov Institute of Physical Chemistry, Russian Academy of Sciences, Moscow
Abstract:
The theoretical foundations, principle of operation, constructional features, and the latest advances in scanning tunnelling and atomic force microscopy in situ are examined in relation to electrochemical studies on the surfaces of metallic electrodes, and adsorption, and electrocrystallisation processes. The bibliography includes 172 references.
Received: 14.03.1995
Citation:
A. I. Danilov, “Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces”, Usp. Khim., 64:8 (1995), 818–833; Russian Chem. Reviews, 64:8 (1995), 767–781
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https://www.mathnet.ru/eng/rcr1250https://doi.org/10.1070/RC1995v064n08ABEH000174 https://www.mathnet.ru/eng/rcr/v64/i8/p818
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