Abstract:
The theoretical foundations, principle of operation, constructional features, and the latest advances in scanning tunnelling and atomic force microscopy in situ are examined in relation to electrochemical studies on the surfaces of metallic electrodes, and adsorption, and electrocrystallisation processes. The bibliography includes 172 references.
Received: 14.03.1995
Bibliographic databases:
Document Type:
Article
UDC:
541.138
Language: English
Original paper language: Russian
Citation:
A. I. Danilov, “Scanning tunnelling and atomic force microscopy in the electrochemistry of surfaces”, Usp. Khim., 64:8 (1995), 818–833; Russian Chem. Reviews, 64:8 (1995), 767–781
Linking options:
https://www.mathnet.ru/eng/rcr1250
https://doi.org/10.1070/RC1995v064n08ABEH000174
https://www.mathnet.ru/eng/rcr/v64/i8/p818
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