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Fizika i Tekhnika Poluprovodnikov, 2016, Volume 50, Issue 1, Pages 17–22
(Mi phts6556)
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This article is cited in 4 scientific papers (total in 4 papers)
Reviews
Simulation of the $\beta$-voltaic effect in silicon pin structures irradiated with electrons from a nickel-63 $\beta$ source
I. Nagornova, V. N. Murashevb a Togliatti State University
b National University of Science and Technology «MISIS», Moscow
Abstract:
The prospects of $\beta$ voltaics as electric-power sources for semiconductor circuits are considered. Experimental studies show that charging of the surface and a decrease in the electrovoltaic power are important. Simulation of the $\beta$-voltaic effect induced by electrons from a nickel-63 source on silicon pin structures is performed; it is shown that the coefficient of the collection of generated charge carriers can be as high as 13%. The dose dependences of the performance efficiency of silicon $\beta$-voltaic structures are determined for the case of irradiation with $\alpha$ particles and $\gamma$-ray photons; it is shown that 1.3 $\times$ 10$^{14}$ and 10$^{20}$ cm$^{-2}$, respectively, are the threshold doses, above which a rapid decrease in efficiency occurs. The optimal parameters of microchannel structures in $\beta$-voltaic electronics, in which the width of the channels and the distance between them correspond to 3 and 10 $\mu$m, are determined.
Received: 13.04.2015 Accepted: 13.05.2015
Citation:
I. Nagornov, V. N. Murashev, “Simulation of the $\beta$-voltaic effect in silicon pin structures irradiated with electrons from a nickel-63 $\beta$ source”, Fizika i Tekhnika Poluprovodnikov, 50:1 (2016), 17–22; Semiconductors, 50:1 (2016), 16–21
Linking options:
https://www.mathnet.ru/eng/phts6556 https://www.mathnet.ru/eng/phts/v50/i1/p17
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Abstract page: | 40 | Full-text PDF : | 12 |
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