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Publications in Math-Net.Ru |
Citations |
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2019 |
1. |
T. S. Argunova, V. G. Kohn, “Study of micropores in single crystals by in-line phase contrast imaging with synchrotron radiation”, UFN, 189:6 (2019), 643–658 ; Phys. Usp., 62:6 (2019), 602–616 |
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2002 |
2. |
V. G. Kohn, “On the theory of X-ray refractive optics: Exact solution for a parabolic medium”, Pis'ma v Zh. Èksper. Teoret. Fiz., 76:10 (2002), 701–704 ; JETP Letters, 76:10 (2002), 600–603 |
24
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1989 |
3. |
M. V. Koval'chuk, V. G. Kohn, E. F. Lobanovich, “Структурная чувствительность кривых фотоэдс в условиях образования
стоячей рентгеновской волны в полупроводнике с $p{-}n$-переходом”, Fizika i Tekhnika Poluprovodnikov, 23:6 (1989), 1054–1057 |
4. |
B. G. Zakharov, A. Yu. Kazimirov, V. G. Kohn, E. A. Sozontov, A. N. Sosfenov, “DETERMINATION OF CRYSTALLOGRAPHIC POLARITY OF CDTE BY THE STANDING X-RAY
WAVE METHOD”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 15:22 (1989), 31–35 |
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1988 |
5. |
A. Yu. Kazimirov, M. V. Koval'chuk, V. G. Kohn, “STUDY OF THE STRUCTURE OF INDIVIDUAL LATTICES IN MULTICOMPONENT
EPITAXIAL IN0.5GA0.5P/GAAS FILMS BY THE STATIONARY X-RAY WAVE METHOD”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 14:15 (1988), 1345–1349 |
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1987 |
6. |
A. Yu. Kazimirov, M. V. Koval'chuk, V. G. Kohn, “Localization of impure atoms in the monocrystal content by the standing x-ray wave method in the Laue geometry”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 13:16 (1987), 982–986 |
1
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1986 |
7. |
M. V. Koval'chuk, D. Lil'ekvist, V. G. Kohn, “The problem of electron transport in the analysis of photoemission data from standing X-ray wave experiments”, Fizika Tverdogo Tela, 28:11 (1986), 3409–3416 |
8. |
V. G. Kohn, “Angular dependence of secondary emission under multiwave X-ray diffraction”, Fizika Tverdogo Tela, 28:10 (1986), 3028–3036 |
9. |
M. V. Koval'chuk, V. G. Kohn, “X-ray standing waves–a new method of studying the structure of crystals”, UFN, 149:1 (1986), 69–103 ; Phys. Usp., 29:5 (1986), 426–446 |
91
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1985 |
10. |
M. V. Koval'chuk, V. G. Kohn, È. F. Lobanovich, “Small deformation measurement in thin epitaxial $\mathrm{si}$ films with photoelectron emission excited by standing X-ray wave”, Fizika Tverdogo Tela, 27:11 (1985), 3379–3387 |
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