Interaction of an electromagnetic $H$-wave with a thin metal film on a dielectric substrate in the case of an anisotropic metal Fermi surface

The interaction of electromagnetic $H$-waves with the thin metal film subject to the shape of the ellipsoidal Fermi surface and a constant mean free path of electrons for various angles of incidence of the electromagnetic waves of theta and different from each other of the coefficients of specularity of $q_1$ and $q_2$ in the reflection of electrons from surfaces of the film is calculated. The metal film is enclosed between two media with permittivity $\varepsilon_1$ and $\varepsilon_2$. The behavior of reflection coefficients $R$, passage $T$ and absorption $A$ from the effective mass of conduction electrons is analyzed.