Registration of infrared photoluminescence spectra using gated integration technique in active baseline subtraction mode

A method based on the Fourier-transform infrared (FTIR) spectrometer has been implemented allowing infrared photoluminescence measurements with a low duty cycle of pump pulses. It reduces the uncontrolled heating of semiconductor structures by pump laser. The method was used to record the infrared photoluminescence spectra of test narrow-gap low dimensional heterostructures in the wavelength range of 1–5 $\mu$m. It was determined that for large reverse duty cycle (more then 20) the developed gated integration method has a better signal-to-noise ratio in the measured spectra compared to the traditionally used synchronous detection method (Lock-in amplification).