Abstract:
The kinetics of electrical damage (breakdown) of polymer films 20–50 μm thick in a constant-sign field of 0.5–0.6 GV/m at 77–300 K has been studied. At elevated temperatures (250–300 K), the exponential temperature dependence of the durability and the above-barrier thermal-fluctuation mechanism of electron emission from traps, i.e., space charge accumulation leading to breakdown, take place. At low temperatures (77–200 K), there are separate local decreases in the durability (minima) at the athermal durability level. The identity of the temperatures of durability minima and measured thermoluminescence maxima of polymers was found. A conclusion is made about the mechanism of thermally stimulated tunneling (subbarrier emission) of electrons from traps.
Citation:
A. I. Slutsker, T. M. Veliev, I. K. Alieva, V. A. Alekperov, Yu. I. Polikarpov, D. D. Karov, “Features of the kinetics of electrical damage of polymers”, Fizika Tverdogo Tela, 58:9 (2016), 1826–1835; Phys. Solid State, 58:9 (2016), 1891–1900
\Bibitem{SluVelAli16}
\by A.~I.~Slutsker, T.~M.~Veliev, I.~K.~Alieva, V.~A.~Alekperov, Yu.~I.~Polikarpov, D.~D.~Karov
\paper Features of the kinetics of electrical damage of polymers
\jour Fizika Tverdogo Tela
\yr 2016
\vol 58
\issue 9
\pages 1826--1835
\mathnet{http://mi.mathnet.ru/ftt9867}
\elib{https://elibrary.ru/item.asp?id=27368758}
\transl
\jour Phys. Solid State
\yr 2016
\vol 58
\issue 9
\pages 1891--1900
\crossref{https://doi.org/10.1134/S1063783416090286}
Linking options:
https://www.mathnet.ru/eng/ftt9867
https://www.mathnet.ru/eng/ftt/v58/i9/p1826
This publication is cited in the following 2 articles:
I. K. Aliyeva, T. G. Naghiyev, E. R. Aliyeva, “Kinetics of electric destruction of polymer compositions”, Mod. Phys. Lett. B, 37:12 (2023)
A. I. Slutsker, T. M. Veliev, I. K. Alieva, V. A. Alekperov, Yu. I. Polikarpov, D. D. Karov, “Effect of mechanical loading on the electrical durability of polymers”, Phys. Solid State, 59:1 (2017), 191–197