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Fizika Tverdogo Tela, 2019, Volume 61, Issue 12, Pages 2442–2445
DOI: https://doi.org/10.21883/FTT.2019.12.48575.03ks (Mi ftt8590) 		 
This article is cited in 3 scientific papers (total in 3 papers)

International Conference ''Mechanisms and Nonlinear Problems of Nucleation, Growth of Crystals and Thin Films'' dedicated to the memory of the outstanding theoretical physicist Professor V.V. Slezov (Proceedings) St. Petersburg, July 1-5, 2019
Surface physics and thin films

Layer crystallization in PZT/LNO/Si heterostructures

A. V. Atanovaa, O. M. Zhigalinaab, D. N. Khmelenina, D. S. Sereginc, K. A. Vorotilovc

a Shubnikov Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia
b Bauman Moscow State Technical University
c MIREA — Russian Technological University, Moscow
Full-text PDF (1084 kB) Citations (3)
DOI: https://doi.org/10.21883/FTT.2019.12.48575.03ks
Abstract: A Pb(Zr$_{0.52}$Ti$_{0.48}$)O$_{3}$–LaNiO$_{3}$–Si composition and LaNiO$_3$ thin films are synthesized using chemical solution deposition and studied by transmission electron microscopy. The polycrystalline, porous structure of LaNiO$_3$ is found to misalign the columnar structure of lead zirconate titanate. The effect that thermal treatment has on the structure and phase composition of lanthanum nickelate is addressed. The morphological features of LaNiO$_3$ film structure such as its layered character, porosity, and misalignment are observed in samples subjected to annealing at a temperature of 550$^\circ$C and are more pronounced upon raising the temperature to 800$^\circ$C.
Keywords: thin films, chemical solution deposition, transmission electron microscopy, lead zirconate titanate, lanthanum nickelate.
Funding agency Grant number
Ministry of Education and Science of the Russian Federation
Russian Foundation for Basic Research 19-29-03058
The structural studies were supported by the Ministry of Science and Higher Education of the Russian Federation within a state assignment by the Federal Scientific Research Centre “Crystallography and Photonics”, Russian Academy of Sciences. The work was carried out using the facilities of the Shared Research Center FSRC “Crystallography and Photonics”, Russian Academy of Sciences (project RFMEFI62119X0035). The synthesis of heterostructures in Russian Technological University (MIREA) was partly funded by the Russian Foundation for Basic Research (grant no. 19-29-03058).
Received: 16.07.2019
Revised: 16.07.2019
Accepted: 25.07.2019
English version:
Physics of the Solid State, 2019, Volume 61, Issue 12, Pages 2464–2467
DOI: https://doi.org/10.1134/S1063783419120035
Bibliographic databases:
Document Type: Article
Language: Russian
Citation: A. V. Atanova, O. M. Zhigalina, D. N. Khmelenin, D. S. Seregin, K. A. Vorotilov, “Layer crystallization in PZT/LNO/Si heterostructures”, Fizika Tverdogo Tela, 61:12 (2019), 2442–2445; Phys. Solid State, 61:12 (2019), 2464–2467
Citation in format AMSBIB
\Bibitem{AtaZhiKhm19}
\by A.~V.~Atanova, O.~M.~Zhigalina, D.~N.~Khmelenin, D.~S.~Seregin, K.~A.~Vorotilov
\paper Layer crystallization in PZT/LNO/Si heterostructures
\jour Fizika Tverdogo Tela
\yr 2019
\vol 61
\issue 12
\pages 2442--2445
\mathnet{http://mi.mathnet.ru/ftt8590}
\crossref{https://doi.org/10.21883/FTT.2019.12.48575.03ks}
\elib{https://elibrary.ru/item.asp?id=42571151}
\transl
\jour Phys. Solid State
\yr 2019
\vol 61
\issue 12
\pages 2464--2467
\crossref{https://doi.org/10.1134/S1063783419120035}
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    • This publication is cited in the following 3 articles:
    Citing articles in Google Scholar: Russian citations, English citations
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