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This article is cited in 1 scientific paper (total in 1 paper)
Surface physics, thin films
Electrophysical properties along the interface of two polymer films of polymethylmethacrylate
A. N. Lachinovab, G. R. Altynshinaa, G. Sh. Baibulovab, M. F. Kianb, A. R. Yusupovb a Institute of Molecule and Crystal Physics, Ufa Federal Research Centre, Russian Academy of Sciences, Ufa, Russia
b Bashkir State Pedagogical University, Ufa, Russia
Abstract:
In this paper, the conductivity along the interface of two dielectric films of submicron thickness has been studied. The results of a comparative study of the electrophysical properties of individual films are presented. A commercial polymer, polymethyl methacrylate, was used as a dielectric material. The studies were carried out according to a two-probe scheme by the method of current-voltage characteristics. An abnormal increase in conductivity with respect to the volume was observed. It was found that the increase in conductivity is associated with an increase in the mobility of charge carriers along the interface to 140 cm$^2$/V$\cdot$s. A comparison is made with analogues known from other references; the need for additional analysis of the properties of a three- dimensional / two-dimensional area contact is emphasized.
Keywords:
polymethyl methacrylate, dielectric films, interface, mobility.
Received: 21.12.2020 Revised: 23.12.2020 Accepted: 23.12.2020
Citation:
A. N. Lachinov, G. R. Altynshina, G. Sh. Baibulova, M. F. Kian, A. R. Yusupov, “Electrophysical properties along the interface of two polymer films of polymethylmethacrylate”, Fizika Tverdogo Tela, 63:4 (2021), 554–558; Phys. Solid State, 63:4 (2021), 577–581
Linking options:
https://www.mathnet.ru/eng/ftt8157 https://www.mathnet.ru/eng/ftt/v63/i4/p554
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