Electrophysical properties along the interface of two polymer films of polymethylmethacrylate

In this paper, the conductivity along the interface of two dielectric films of submicron thickness has been studied. The results of a comparative study of the electrophysical properties of individual films are presented. A commercial polymer, polymethyl methacrylate, was used as a dielectric material. The studies were carried out according to a two-probe scheme by the method of current-voltage characteristics. An abnormal increase in conductivity with respect to the volume was observed. It was found that the increase in conductivity is associated with an increase in the mobility of charge carriers along the interface to 140 cm$^2$/V$\cdot$s. A comparison is made with analogues known from other references; the need for additional analysis of the properties of a three- dimensional / two-dimensional area contact is emphasized.