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Avtomatika i Telemekhanika, 1985, Issue 3, Pages 111–121 (Mi at6912)  

Technical Diagnostics

Test and functional diagnosis of digital devices and systems

I. P. Litikov, E. S. Sogomonyan

Moscow
Abstract: The necessity in periodic check of test functional diagnostic digital devices and systems containing self-check tools for built-in diagnostics is attributable to the need to detect such faults which do not show up on a specified time interval. A ring-like register is proposed for this purpose whose feedbacks are closed through diagnostics circuits. Structural circuits of devices and systems completely self-checking and selftesting, on a specified time interval are discussed.

Received: 03.03.1984
Bibliographic databases:
Document Type: Article
UDC: 681.3.26.7
Language: Russian
Citation: I. P. Litikov, E. S. Sogomonyan, “Test and functional diagnosis of digital devices and systems”, Avtomat. i Telemekh., 1985, no. 3, 111–121; Autom. Remote Control, 46:3 (1985), 375–384
Citation in format AMSBIB
\Bibitem{LitSog85}
\by I.~P.~Litikov, E.~S.~Sogomonyan
\paper Test and functional diagnosis of digital devices and systems
\jour Avtomat. i Telemekh.
\yr 1985
\issue 3
\pages 111--121
\mathnet{http://mi.mathnet.ru/at6912}
\zmath{https://zbmath.org/?q=an:0577.94023}
\transl
\jour Autom. Remote Control
\yr 1985
\vol 46
\issue 3
\pages 375--384
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