An unconditional algorithm of search for multiple faults in combinational devices

An approach is described to search for multiple faults in combinational circuits whereby groups of test sets are used responses to which reveal operational branches. An algorithm is proposed for design of complete tests made of groups of; sets for search for multiple faults; identification of operational branches in a faulty circuit from the results of feeding the test data is shown to lead to a maximal depth of search for multiple faults in an arbitrary combinational device. The search algorithm remains unconditional and does not require analysis of the circuit topology or pror cessing of large bodies of data in search.