Аннотация:
Приведен анализ современного состояния исследований процессов и механизмов дефектообразования и трекообразования при облучении материалов быстрыми ионами. Показано, что природа и морфология треков зависят от типа твердых тел, структурного состояния и плотности выделенной энергии в их электронную подсистему. Релаксация сильных электронных возбуждений имеет доминирующее значение в процессе трекообразования. Обсуждаются механизмы формирования прерывистых треков, трековой миграции атомов и трекового каналирования ионов.
Поступила:18 июля 2002 г. Доработана: 15 января 2003 г.
Образец цитирования:
Ф. Ф. Комаров, “Дефектообразование и трекообразование в твердых телах при облучении ионами сверхвысоких энергий”, УФН, 173:12 (2003), 1287–1318; Phys. Usp., 46:12 (2003), 1253–1282
Эта публикация цитируется в следующих 112 статьяx:
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